SDL PUF：高可靠自适应偏差锁定PUF电路

张源; 罗静茹; 张吉良

doi:10.11999/JEIT231313

SDL PUF：高可靠自适应偏差锁定PUF电路

doi: 10.11999/JEIT231313

湖南大学半导体学院(集成电路学院) 长沙 410000

基金项目: 国家自然科学基金(U20A20202, 62122023)

详细信息

作者简介:
张源：男，博士生，研究方向为硬件安全及集成电路设计

罗静茹：女，硕士生，研究方向为硬件安全

张吉良：男，教授，博士生导师，研究方向为集成电路硬件安全、安全集成电路设计、后摩尔时代新型计算架构等

通讯作者:
张吉良　zhangjiliang@hnu.edu.cn

中图分类号: TN402
计量
- 文章访问数: 49
- HTML全文浏览量: 26
- PDF下载量: 11
- 被引次数: 0
出版历程
- 收稿日期: 2023-11-29
- 修回日期: 2024-05-21
- 网络出版日期: 2024-05-23
- 刊出日期: 2024-05-10

SDL PUF: A High Reliability Self-Adaption Deviation Locking PUF

College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha 410000, China

Funds: The National Natural Science Foundation of China(U20A20202, 62122023)

摘要

摘要: 物理不可克隆函数(Physical Unclonable Function, PUF)作为一种新的硬件安全原语，通过提取工艺偏差产生唯一的响应序列为计算系统提供可信根。然而现有基于现场可编辑门阵列(Field Programmable Gate Array, FPGA)的PUF难以在较宽的温度和电压范围内实现高可靠性。该文提出一种基于自定时环(Self-Timed Ring，STR)的自适应偏差锁定PUF(Self-adaption Deviation Locking PUF, SDL PUF)，首先利用STR延迟引起的振荡频率差产生PUF响应；然后通过在初始化阶段自适应配置，有效扩大STR环内的事件到达时间偏差，从而显著提高PUF的可靠性；最后进一步提出一种对比混淆策略，通过提取工艺偏差自动生成随机比特配置并混淆比较器，以抵抗侧信道攻击。在Xilinx Virtex-6 FPGA上实验结果表明， SDL PUF在0～80°C的温度范围和0.85～1.15V的电压范围内误码率为0，唯一性和均匀性分别为49.29%和49.84%。
- 物理不可克隆函数 /
- 自定时环 /
- FPGA /
- 可靠性
Abstract: As a novel hardware security primitive, Physical Unclonable Function (PUF) extracts process deviations to generate a unique response sequence, providing a root of trust for computing systems. However, existing PUFs based on Field Programmable Gate Arrays (FPGAs) cannot maintain high reliability over a wide range of temperatures and voltages. In this work, we propose a Self-Timed Ring (STR) based Self-adaption Deviation Locking PUF (SDL PUF). Firstly, the PUF response is generated utilizing the oscillation frequency difference caused by the STR delay. Secondly, the adaptive configuration in the initialization stage can effectively expand the deviation of the event arrival time in the STR, substantially enhancing the reliability of PUF. Finally, a comparator obfuscation strategy is proposed, automatically configuring the comparator by extracting the process deviation to resist the side-channel attack. The proposed structure is implemented on a Xilinx Virtex-6 FPGA. Experimental results show that the proposed SDL PUF achieves 0 bit error rate in the temperature range of 0°C～80°C and the voltage range of 0.85～1.15V, and ensures 49.29% uniqueness and 49.84% uniformity while maintaining high reliability.
- Physical unclonable function /
- Self-timed ring /
- FPGA /
- Reliability

HTML全文

图 1 传统RO PUF结构

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图 2 一个STR的基本结构和真值表

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图 3 在STRs中的非均匀振荡和均匀振荡的传播模式

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图 4 SDL PUF的总体架构

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图 5 SDL PUF 的熵源结构和自适应配置过程

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图 6 对比混淆方案

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图 7 均匀性测试

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图 8 唯一性测试

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图 9 电压和温度鲁棒性测试

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表 1 PUF性能对比

PUF种类	FPGA平台	唯一性(%)	可靠性(%)	是否能实现零误码 (零误码范围)	熵源面积*
文献[6]	Artix-7	49～50	≥99	×	12LUTs, 24MUXs
文献[9]	Spartan-6	49.07	99.80	×	12LUTs
文献[16]	Spartan-7	49.98	98.61	×	12 LUTs, 11MUXs
文献[21]	Artix-7	48.74	98.91	×	12LUTs
文献[22]	Artix-7	47.65	97.36	×	12LUTs
本文SDL PUF	Virtex-6	49.29	99.84	√(0°C～80°C, 0.85～1.15V)	12 LUTs
*熵源振荡环统一设定为12阶

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