硅CVD外延自掺杂效应的分析研究
RESEARCH ON REDUCING THE SELF-DOPING DURING SILICON CVD EPITAXY
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摘要: 本文首先对自掺杂机理进行了分析。并采用反向补偿原理,吸附-解吸、滞流层静态-动态转换等,对工艺进行优化,在通常条件下有效地控制了自掺杂。Abstract: This paper, first, analyzes self-doping mechanism, then develops an optimization technology by using the contrary compensation principle, adsorption-desorption mechanism and transform of viscous flow layer between static and dymanic conditons. It results in controlling efffectively self-doping under normal condition.
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