双极晶体管的1/f噪声参数fL和的测量提取噪声电流谱测量法
MEASUREMENT OF PARAMETERS fL AND OF 1/f NOISE IN BJTBASED ON THE MEASURING METHOD OF NOISE CURRENT SPECTRA
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摘要: 晶体管低频噪声主要是1/f噪声,其参数fL和的测出,不仅对低频低噪声设计,而且对于研究半导体噪声机理以及应用它来分析半导体内部缺陷或表面清洁处理情况都有着重要意义。本文给出了双极晶体管的1/f噪声参数的测量方法、系统及实例,获得了已有噪声测量系统所不能给出的参数。
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关键词:
- 噪声测量; 1/f噪声; fL和参数
Abstract: The method and system for measuring parametros of fL and of 1/f noise in BJT are presented. Finally, the examples are given. -
L. Loreck et al., IEEE Electron Device Lett., EDL-5(1984)1, 9.[2]C. D. Motchenbacken, F. C. Fitchen, Low-Noise Electronic Design, John Wiley Sons. Inc,[3]N. Y., (1973), Chapter 4.[4]M. Macucci et al., IEEE Trans. on IM, IM-40(1991)1, 7-12.[5]罗涛, 戴逸松,电子学报,18(1990)6,79-86. -
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