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用场发射显微镜测量单壁碳纳米管的逸出功

张兆祥 孙建平 侯士敏 赵兴钰 施祖进 顾镇南 刘惟敏 薛增泉

张兆祥, 孙建平, 侯士敏, 赵兴钰, 施祖进, 顾镇南, 刘惟敏, 薛增泉. 用场发射显微镜测量单壁碳纳米管的逸出功[J]. 电子与信息学报, 2002, 24(11): 1708-1713.
引用本文: 张兆祥, 孙建平, 侯士敏, 赵兴钰, 施祖进, 顾镇南, 刘惟敏, 薛增泉. 用场发射显微镜测量单壁碳纳米管的逸出功[J]. 电子与信息学报, 2002, 24(11): 1708-1713.
Zhang Zhaoxiang, Sun Jianping, Hou Shimin, Zhao Xingyu, Shi Zujin, Gu Zhennan, Liu Weimin, Xue Zengquan. Field emission microscopy study of the work function of single-walled carbon nanotubes[J]. Journal of Electronics & Information Technology, 2002, 24(11): 1708-1713.
Citation: Zhang Zhaoxiang, Sun Jianping, Hou Shimin, Zhao Xingyu, Shi Zujin, Gu Zhennan, Liu Weimin, Xue Zengquan. Field emission microscopy study of the work function of single-walled carbon nanotubes[J]. Journal of Electronics & Information Technology, 2002, 24(11): 1708-1713.

用场发射显微镜测量单壁碳纳米管的逸出功

Field emission microscopy study of the work function of single-walled carbon nanotubes

  • 摘要: 该文利用场发射显微镜对单壁碳纳米管的逸出功进行了研究和测量。未进行加热除气的单壁碳纳米管的表面吸附大量气体,此时测量的逸出功不是清洁表面单壁碳纳米管的逸出功。实验首先加热除气得到单壁碳纳米管的场发射清洁像,然后利用场发射显微镜测量I-V曲线,得到Fowler-Nordheim直线斜率;再利用透射电镜观测单壁碳纳米管微束形貌像,测量管束半径,通过三种公式估算比例因子,最后计算得到单壁碳纳米管的逸出功。
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出版历程
  • 收稿日期:  2001-03-07
  • 修回日期:  2001-07-18
  • 刊出日期:  2002-11-19

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