DCTT统计最优化模型及其性质
DCTT STATISTICAL OPTIMIZATION METHOD AND ITS FEATURES
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摘要: 本文提出了集成电路最优化中综合考虑成品率极大、最佳容差设计、调整设计和生产效益极大化设计的统计最优化模型(Design Centering,Tolerance and Tuning.简称DCTT模型)。讨论了该模型与广义统计最优化模型的等价性以及其他主要性质。在确定性最优化框架下,该模型为统计最优化和集成电路可制造性设计的进一步发展开辟了新途径。
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关键词:
- 集成电路; 统计最优化; 不可微规划
Abstract: A statistical optimization method of integrated circuit design is proposed. This model summerizes optimal centering design of yield maximization, optimal tolerance, tuning design and maximum production profit design. The equivalence between this method and the general statistical optimization method is discussed, and the main features of the model are given. Based on the frame of deterministic optimization method, the general statistical optimization method can be improved further by the model proposed in this paper. -
J. W. Bandler, S. Clien, IEEE Trans. on MTT[2]MTT-33 (1988) 3, 424-441.[3]K. Mozumder, A. J. Strojwas, Proc. IEEE, 78(1990) 2, 435-454.[4]郝跃,应用科学学报,9(1991)3,233-242.[5]郝 跃,西安电子科技大学学报,17(1990)4,76-81.[6]J. P. Spoto et al., IEEE Trans. on CAD/IC, CAD-5 (1986) 1, 90-106.[7]郝跃,电子科学学刊,13(1991)1,78-82.[8]K. W. Kiwiel, Method of Descent for Nondifferentiable Optimization, Springer-Verlag, Berlin. (1985), Chap. 7.[9]D. G. Luenberger, Introduction to Linear and Nonlinear Programming, Addision-Wesley, Publi[10]shing Co. (1973), Chap. 5.[11][9][12]J. W. Bandler et al.,IEEE Trans, on MTT,MTT-33 (1985) 12, 1519-1530. -
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