高级搜索

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

一种基于扇出重汇聚的可测性评估方法

吴文俊 梁华国 游畅 窦贤锐 肖家辉 鲁迎春

吴文俊, 梁华国, 游畅, 窦贤锐, 肖家辉, 鲁迎春. 一种基于扇出重汇聚的可测性评估方法[J]. 电子与信息学报. doi: 10.11999/JEIT251286
引用本文: 吴文俊, 梁华国, 游畅, 窦贤锐, 肖家辉, 鲁迎春. 一种基于扇出重汇聚的可测性评估方法[J]. 电子与信息学报. doi: 10.11999/JEIT251286
WU Wenjun, LIANG Huaguo, YOU Chang, DOU Xianrui, XIAO Jiahui, LU Yingchun. A Testability Evaluation Method Based on Reconvergent Fan-out[J]. Journal of Electronics & Information Technology. doi: 10.11999/JEIT251286
Citation: WU Wenjun, LIANG Huaguo, YOU Chang, DOU Xianrui, XIAO Jiahui, LU Yingchun. A Testability Evaluation Method Based on Reconvergent Fan-out[J]. Journal of Electronics & Information Technology. doi: 10.11999/JEIT251286

一种基于扇出重汇聚的可测性评估方法

doi: 10.11999/JEIT251286 cstr: 32379.14.JEIT251286
基金项目: 国家重大科研仪器研制项目(62027815),国家自然科学基金资助项目(62174048, 62274052)
详细信息
    作者简介:

    吴文俊:男,硕士,研究方向为集成电路测试

    梁华国:男,教授,研究方向为容错计算与硬件安全

    游畅:男,硕士,研究方向为集成电路硬件安全技术

    窦贤锐:男,博士生,研究方向为集成电路测试

    肖家辉:男,硕士,研究方向为集成电路测试

    鲁迎春:男,副教授,研究方向为集成电路硬件安全技术

    通讯作者:

    梁华国 huagulg@hfut.edu.cn

  • 中图分类号: TN407

A Testability Evaluation Method Based on Reconvergent Fan-out

Funds: The National Major Research Instrument Development Project (62027815), The National Natural Science Foundation of China Key Project (62174048, 62274052)
  • 摘要: 随着电路规模和复杂度的不断提升,可测性分析已成为电路设计与测试阶段中评估电路质量与优化测试点配置的关键环节。然而,现有方法在处理信号相关性与扇出重汇聚结构时,普遍存在精度不足与计算开销较大的问题,难以兼顾效率与准确性。为此,该文提出一种基于扇出重汇聚的可测性评估方法。该方法通过解析电路拓扑识别扇出重汇聚区域,构建结构相关的加权可测性计算模型,并实现了高效的可测性分析算法框架,以在保证精度的同时提升计算效率。实验结果表明,本文方法在可控性预测中均方根误差平均降低约25%,确保精度的同时,计算时间平均加速7倍,在故障覆盖率预测以及排序一致性检测中亦表现优异。
  • 图  1  COP算法计算规则

    图  2  扇出重汇聚结构示意图

    图  3  基于扇出重汇聚的可测性评估方案流程图

    图  4  双扇出重汇聚情况分析

    图  5  CPU运行时间对比图

     Algorithm 1: Find_RFO_structure
     INPUT:sorted_list - circuit nodes in topological order
     OUTPUT:RFO_info - identified RFO information
     for each node v in sorted_list do
      if fan-out >1 then    /* find candidate root node*/
       create struct_info(v)  /*set Si*/
      else if struct_info(v) repeat then   /*candidate RFON*/
       create candidate root set RS_v   /*set RSi*/
       for each root r in RS_v do
        if struct_info(r) ∩ RS_v is not empty then
         delete r from RS_v    /* follow rule 1*/
       for each RFON r in node v RFO structure do
        if RS_r ∩ struct_info(v) is not empty then
         add r into RS_v     /* follow rule 2*/
      propagate_struct_info(v)
     return RFO_info
    下载: 导出CSV
     Algorithm 2: RFO_based_testability_computation
     INPUT:sorted_list - circuit nodes in topological order
         RFO_info - identified RFO information
     OUTPUT:controllability C(v) and observability O(v)
     for each node v in sorted_list do /*calculate controllability*/
      if v is a primary input then
       C(v) ← 0.5 /*initialize primary input*/
      else if v is RFON then
       C(v) ← RFON_based_ctrl_cal(v) /*follow formula 6*/
      else
       C(v) ← cop_ctrl_calculate(v) /*follow rules of Fig. 1*/
       create/propagate conditional_probability_info(v)
     for each node v in invert_sorted_list do /*calculate
     observability*/
      if v is a primary output then
       O(v) ← 1 /*initialize primary output*/
      else if v is in RFO structure then
       O(v) ← RFON_based_obsv_cal(v) /*follow formula 6*/
       create/propagate conditional_probability_info(v)
      else
       O(v) ← cop_obsv_calculate(v) /*follow rules of Fig. 1*/
     return {C(v), O(v)} for all v
    下载: 导出CSV

    表  1  电路基本信息及故障覆盖率相对误差对比表

    CircuitGate_numbMax_numbFault_coverage(%)FC_RE(%)
    [5][7][12]RFO
    s12386311694.290.790.871.620.85
    s33841868392.711.191.220.91.52
    s923461732082.161.752.7511.120.5
    s132079262359120.870.180.64
    s3593217793289.251.952.193.142.23
    s38584227641793.011.131.581.630.01
    c135510383396.882.862.813.12.43
    c62884544399.370.630.630.630.08
    b14109266787.0818.421.374.550.36
    b17368973769.7813.9813.7615.9313.12
    b188572410175.951.092.1621.042.17
    b21225456987.3918.710.522.670.31
    adder1279389.1812.1312.1312.112.13
    arbiter6743835.1511.9312.1319.2310.63
    dec309098.321.711.711.711.71
    max3350647.724.844.833.67.37
    voter13698894.495.815.815.85.82
    Average5.943.966.413.64
    下载: 导出CSV

    表  2  可控性值RMSE与斯皮尔曼系数对比表 (%)

    circuitRMSE−30%−onlyρ
    [5][7][12]RFO[5]_ρ[7]_ρ[12]_ρRFO_ρ
    s12380.01270.00730.05700.00860.99560.99620.95780.9968
    s33840.03030.01920.03540.01870.88320.89900.78770.9144
    s92340.03110.01830.18940.02000.84800.87580.41020.8732
    s132070.04080.02500.21640.02450.84810.86920.26000.8858
    s359320.05950.04370.06510.03780.82230.86150.79830.8663
    s385840.02780.01600.11410.01690.93960.96010.77410.9680
    c13550.06440.04390.11960.02180.91790.94240.87950.9474
    c62880.09840.07190.19580.04700.85110.89690.50780.9630
    b140.04330.04100.06240.04090.94440.94470.92720.9452
    b170.01930.01890.07370.01890.97540.97630.90340.9773
    b180.04340.02780.0790.04140.96630.98060.92010.9712
    b210.04910.04250.05990.04420.93400.94070.92270.9400
    adder0.03370.02040.05320.00150.89670.90130.86470.9265
    arbiter0.00530.00450.01850.00340.99020.98940.97820.9889
    dec0.52160.52160.51940.52161.00001.00000.86881.0000
    max0.02940.02060.03710.01840.90590.91700.89250.9178
    voter0.09350.08240.07440.07960.78110.80330.86090.8132
    Average0.07080.06030.11590.05680.91180.92670.79490.935
    下载: 导出CSV
  • [1] WANG L T, WU Chengwen, and WEN Xiaoqing. VLSI Test Principles and Architectures: Design for Testability[M]. San Francisco: Morgan Kaufmann Publishers, 2006: 1–34.
    [2] POMERANZ I. Diagnostic test point insertion and test compaction[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023, 31(2): 276–285. doi: 10.1109/TVLSI.2022.3218924.
    [3] KIM J, KIM H, PARK J, et al. A new test point insertion using weight adjusted grouping[J]. IEEE Access, 2025, 13: 95934–95944. doi: 10.1109/ACCESS.2025.3575800.
    [4] GOLDSTEIN L H and THIGPEN E L. SCOAP: Sandia controllability/observability analysis program[C]. Proceedings of the 17th Design Automation Conference, Minneapolis, USA, 1980: 190–196. doi: 10.1145/800139.804528.
    [5] BRGLEZ F. On testability analysis of combinational networks[J]. IEEE International Symposium on Circuits and Systems, 1984, 1: 221–225.
    [6] SCHLITT L, AGNIHOTRI P, KALLA P, et al. Silicon photonic test-point selection by integrating design parameters with hypergraph partitioning[C]. Proceedings of 2025 IEEE International Test Conference, San Diego, USA, 2025: 262–271. doi: 10.1109/ITC58126.2025.00033.
    [7] CHANG A C C, HUANG R H M, and WEN C H P. CASSER: A closed-form analysis framework for statistical soft error rate[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21(10): 1837–1848. doi: 10.1109/TVLSI.2012.2220386.
    [8] CHEN Liang, EBRAHIMI M, and TAHOORI M B. CEP: Correlated error propagation for hierarchical soft error analysis[J]. Journal of Electronic Testing, 2013, 29(2): 143–158. doi: 10.1007/s10836-013-5365-0.
    [9] CHEN Chunhong and ZHAN Suoyue. A hybrid method for signal probability estimation with combinational circuits[C]. Proceedings of 2022 IEEE Asia Pacific Conference on Circuits and Systems, Shenzhen, China, 2022: 472–475. doi: 10.1109/APCCAS55924.2022.10090301.
    [10] JAHANIRAD H. CC-SPRA: Correlation coefficients approach for signal probability-based reliability analysis[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2019, 27(4): 927–939. doi: 10.1109/TVLSI.2018.2886027.
    [11] WU Nan, LI Yingjie, YANG Hang, et al. Survey of machine learning for software-assisted hardware design verification: Past, present, and prospect[J]. ACM Transactions on Design Automation of Electronic Systems, 2024, 29(4): 59. doi: 10.1145/3661308.
    [12] IMMANUEL J and MILLICAN S K. Calculating signal controllability using neural networks: Improvements to testability analysis and test point insertion[C]. Proceedings of the 2020 IEEE 29th North Atlantic Test Workshop, Albany, USA, 2020: 1–6. doi: 10.1109/NATW49237.2020.9153082.
    [13] LI Min, KHAN S, SHI Zhengyuan, et al. DeepGate: Learning neural representations of logic gates[C]. Proceedings of the 59th ACM/IEEE Design Automation Conference, San Francisco, USA, 2022: 667–672. doi: 10.1145/3489517.3530497.
    [14] CHAO Zhiteng, SUN Bin, LYU Hongqin, et al. HighTPI: A hierarchical graph based intelligent method for test point insertion[C]. Proceedings of the 2025 IEEE 43rd VLSI Test Symposium, Tempe, USA, 2025: 1–7. doi: 10.1109/VTS65138.2025.11022820.
    [15] DAS N, PAULS F, HASLER M, et al. A survey on recent developments in SCOAP-based hardware Trojan detection strategies[C]. Proceedings of 2025 IEEE International Symposium on Circuits and Systems, London, United Kingdom, 2025: 1–5. doi: 10.1109/ISCAS56072.2025.11043879.
    [16] RAKESH M B, DAS P, SAI PRANAV K R, et al. GRIPT: Graph attention-assisted inductive methodology for fast and accurate average power estimation from RTL simulation skipping gate-level simulation[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2025, 44(11): 4209–4221. doi: 10.1109/TCAD.2025.3563420.
    [17] PARIA S, GAIKWAD P, DASGUPTA A, et al. LATENT: Leveraging automated test pattern generation for hardware Trojan detection[C]. Proceedings of the 2024 IEEE 33rd Asian Test Symposium, Ahmedabad, India, 2024: 1–6. doi: 10.1109/ATS64447.2024.10915238.
    [18] ABRAMOVICI M, BREUER M A, and FRIEDMAN A D. Digital Systems Testing and Testable Design[M]. Beijing: Tsinghua University Press, 2004: 1–36.
  • 加载中
图(5) / 表(4)
计量
  • 文章访问数:  13
  • HTML全文浏览量:  4
  • PDF下载量:  1
  • 被引次数: 0
出版历程
  • 收稿日期:  2025-12-03
  • 修回日期:  2026-03-09
  • 录用日期:  2026-03-09
  • 网络出版日期:  2026-03-22

目录

    /

    返回文章
    返回