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基于二极管单元的高密度掩模ROM设计

叶勇 亢勇 宋志棠 陈邦明

叶勇, 亢勇, 宋志棠, 陈邦明. 基于二极管单元的高密度掩模ROM设计[J]. 电子与信息学报, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938
引用本文: 叶勇, 亢勇, 宋志棠, 陈邦明. 基于二极管单元的高密度掩模ROM设计[J]. 电子与信息学报, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938
YE Yong, KANG Yong, SONG Zhitang, CHEN Bangming. Design of High-density Mask ROM Based on Diode Cells[J]. Journal of Electronics & Information Technology, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938
Citation: YE Yong, KANG Yong, SONG Zhitang, CHEN Bangming. Design of High-density Mask ROM Based on Diode Cells[J]. Journal of Electronics & Information Technology, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938

基于二极管单元的高密度掩模ROM设计

doi: 10.11999/JEIT160938
基金项目: 

中国科学院战略性先导科技专项(XDA09020402),国家重点基础研究发展计划(2013CBA01904, 2013CBA01900, 2010CB 934300, 2011CBA00607, 2011CB932804),国家集成电路重大专项(2009ZX02023-003),国家自然科学基金(61076121, 61176122, 61106001, 61261160500, 61376006)

Design of High-density Mask ROM Based on Diode Cells

Funds: 

Strategic Priority Research Program of the Chinese Academy of Sciences (XDA09020402), The National Key Basic Research Program of China (2013CBA01904, 2013CBA01900, 2010CB934300, 2011CBA00607, 2011CB932804), The National Integrate Circuit Research Program of China (2009ZX02023-003), The National Natural Science Foundation of China (61076121, 61176122, 61106001, 61261160500, 61376006)

  • 摘要: 针对传统ROM(Read-Only Memory)存储密度低、功耗高的问题,该文提出一种采用二极管单元并通过接触孔编程来存储数据的掩模ROM。二极管阵列采用双沟槽隔离工艺和无间隙接触孔连接方式实现了极高的存储密度。基于此设计了一款容量为2 Mb的掩模ROM,包含8个256 kb的子阵列。二极管阵列采用40 nm设计规则,外围逻辑电路采用2.5 V CMOS工艺完成设计。二极管单元的有效面积仅为0.017m2,存储密度高达0.0268 mm2/Mb。测试结果显示二极管单元具备良好的单元特性,在2.5 V电压下2 Mb ROM的比特良率达到了99.8%。
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出版历程
  • 收稿日期:  2016-09-19
  • 修回日期:  2017-01-22
  • 刊出日期:  2017-06-19

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