模拟集成电路的测试节点选择
Test Point Selection for Analog Integrated Circuit
-
摘要: 如何寻求一个最佳的测试节点或测试矢量集是模拟集成电路的故障诊断中的重要问题。该文提出了一种基于可测性测度计算的测试节点选择方法。利用行列式判决图,可以有效而准确地求得被测电路传输函数的符号表达式和计算出其可测性测度。该方法完全消除了由数字方法引入的不可避免的舍入误差,并能处理中、大规模的集成电路.Abstract: How to select an optimum set of test points or test vectors has become very critical to analog integrated circuit fault diagnosis. A test point selection method based on testability measure is presented in this paper. Using Determinant Decision Diagrams (DDDs), symbolic transfer functions of circuit under test are constructed and its testability measure can be calculated exactly and efficiently. This method eliminates completely the unavoidable round-off errors introduced by numerical algorithms and can handle moderate or large integrated circuits.
-
Fedi G, Luchetta A, Manetti S, Piccirilli M C. A new symbolic method for analog circuit testability evaluation[J].IEEE Trans. on Instrumentation and Measurement.1998, 47(2):554-565[2]Berkowitz R S. Conditions for network-element-value solvability. IEEE Trans. on Circuit Theory,1962, CT-9(1): 24-29.[3]Sakes R. A measure of testability and its application to test point selection theory. in Proc. of the 20th Midwest Symposium on Circuits and Systems, Lubbock, Texas Tech. Univ., 1977: 576-583.[4]Liberatore A, Manetti S, Piccirilli M C. A new efficient method for analog circuit testability measurement. in Proc. of Instrumentation and Measurement Technology Conference, Hamamatsu,Japan, 1994: 193-196.[5]Tao Pi, C. -J. Richard Shi. Analog testability analysis by determinant-decision-diagrams based symbolic analysis. in Proc. of the ASP-DAC 2000, Yokohama, Japan, 2000: 541-546.[6]Manthe A, C. -J. Richard Shi. Lower bound based DDD minimization for efficient symbolic circuit analysis. in Proc. of 2001 IEEE International Conference on Computer Design, Los Alamitos,California, 2001: 374-379.[7]Xiangdong Tan, C. -J. Richard Shi. Hierarchical symbolic analysts of large analog circuits with determinant decision diagrams. in Proc. of the 1998 IEEE International Symposium on Circuits and Systems, Monterey, CA, 1998: 318-321. -
计量
- 文章访问数: 2345
- HTML全文浏览量: 109
- PDF下载量: 765
- 被引次数: 0
下载:
