VLSI冗余单元最优分配的遗传算法求解
USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI
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摘要: 随着VLSI芯片面积的增加和电路复杂性的增强,芯片的成品率受制造缺陷影响的概率逐渐增加。为了解决这一问题,人们将容错技术结合入集成电路设计中。要使一个系统具有较强的容错能力,必须给系统提供一定量冗余单元。本文利用遗传算法有效地解决了使系统成品率达到最大的冗余单元最优分配问题。Abstract: An increase in chip area and circuit complexity leads to a reduction in the yield of production. In order to solve the problem of low yield by defects in process of large scale integrated circuits manufacture, the fault-tolerant technique is introduced into the integrated circuits design. A system must be provided with a certain quantity of spare elements to have the ability of fault-tolerance. In this paper, the problem of optimal spare allocation for fault-tolerant VLSI is solved effectively by means of genetic algorithm.
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C.Thibeault,Y.Savaria,J-L.Houle,A fast method to evaluate the optimum number of spares in defect-tolerant integrated circuits,IEEE Trans.on Comput.,1994,C-43(6),687-697.[2]W.Shi,W.K.Fuchs,Optimal spare allocation for defect-tolerant VLSI,in Proc.IEEE Int.Conf.Wafer Scale Integration,San Francisco,California,USA,1992,193-199.[3]云庆夏,黄光球,王战权,遗传算法和遗传规划,北京,冶金工业出版社,1997,21-38.[4]D.E.Goldberg,Genetic Algorithms in Search,Optimization and Machine Learning,Reading,MA,Addsion-Wesley,1989,97-108. -
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