组合电路最优Hopfield模型的判定
DECISION OF OPTIMAL HOPFIELD NEURAL NETWORKS OF COMBINATIONAL CIRCUITS
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摘要: 采用组合电路Hopfield模型,通过相容状态建立的齐次线性方程组的基础解系,提出了组合电路最优Hopfield模型存在性的实用判定方法,并给出了计算实例。Abstract: By use of Hopfield model and basis solution of homogeneous linear equations which are established in accordance with consistent state, a practical decision method for the existence of optimal Hopfield model of combinational circuits is provided. Finally, several examples are given.
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Chakradhar S T, Bushnell M L, Agrawal V D. Automatic Test Generation Using Neural Networks. IEEE Int. Conf. on CAD, Santa Clara: 1988, 416-419.[2]Chakradhar S T, Bushnell M L, Agrawal V D. IEEE Trans. on CAD, 1990, CAD-9(9): 981-994.[3]Chakradhar S T, Agrawal V D, Bushnell M L. Polynomial Time Solvalle Fault Detection Problems. IEEE Int. Symp. on Fault-Tolerant Computing, Newcastle upon Tyne: 1990, 56-63.[4]Fujiwara H. Three Valued Neural Networks for Test Generation. IEEE Int. Symp. on Fault-Tolerant Computing, Newcastle upon Tyne: 1990, 64-71.[5]张中,魏道政.电子学报,1993, 21(8): 77-81. -
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