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版图面积受限POR电路中复位延迟问题的研究

屈小钢 杨海钢

屈小钢, 杨海钢. 版图面积受限POR电路中复位延迟问题的研究[J]. 电子与信息学报, 2010, 32(6): 1389-1394. doi: 10.3724/SP.J.1146.2009.00873
引用本文: 屈小钢, 杨海钢. 版图面积受限POR电路中复位延迟问题的研究[J]. 电子与信息学报, 2010, 32(6): 1389-1394. doi: 10.3724/SP.J.1146.2009.00873
Qu Xiao-gang, Yang Hai-gang. Design Technique for Generating Large Delay in Area-Constraint Power-On Reset Circuit[J]. Journal of Electronics & Information Technology, 2010, 32(6): 1389-1394. doi: 10.3724/SP.J.1146.2009.00873
Citation: Qu Xiao-gang, Yang Hai-gang. Design Technique for Generating Large Delay in Area-Constraint Power-On Reset Circuit[J]. Journal of Electronics & Information Technology, 2010, 32(6): 1389-1394. doi: 10.3724/SP.J.1146.2009.00873

版图面积受限POR电路中复位延迟问题的研究

doi: 10.3724/SP.J.1146.2009.00873

Design Technique for Generating Large Delay in Area-Constraint Power-On Reset Circuit

  • 摘要: 针对上电复位电路中实现毫秒级复位时间的电阻和电容所需面积过大的问题,该文给出了一种基于指数时间扩展技术的面积有效的延时电路。该电路利用环形振荡器产生信号的周期作为参考单位延时,通过异步分频实现增大的指数倍的延时,能在节省芯片面积的情况下实现毫秒级延时,在上电复位电路中实现足够长的复位时间。同时,该文给出了SMIC 0.18 m工艺下设计的SPICE仿真和实验测试结果。实现延迟时间0.91 ms和54.9 ms时,电路版图面积分别约为172m75 m和172 m95 m。与通常的RC方法相比,实现相同的延时至少各节省约82.8%和97%的面积。
  • Takeo Yasuda, Masaaki Yamamoto, and Takafumi Nishi. A power-on reset pulse generator for low voltage applications[C]. IEEE International Symposium on Circuits and Systems, Sydney, May 6-9, 2001, 4: 598-601.[2]Chen Kuo-Hsing and Lo Yu-Lung. A fast-lock DLL with power-on reset circuit[C]. Proc. International Symposium on Circuits and Systems, Vancouver, May 23-26, 2004, 4: 357-360.[3]McClintock C. Method and apparatus for creating a large delay in a pulse in a layout efficient manner[P]. US, No. 5606276, 1997.[4]Wadhwa S K, Siddhartha G K, and Gaurav A. Zero steady state current power-on-reset circuit with brown-out detector[C]. Proc. 19th International Conference on VLSI Design, Hyderabad, Jan. 3-7, 2006: 631-636.[5]Ker Ming-Dou, Yen Cheng-Cheng, and Shih Pi-Chia. On-chip transient detection circuit for system-level ESD protection in CMOS integrated circuits to meet electromagnetic compatibility regulation[J].IEEE Transactions on Electromagnetic Compatibility.2008, 50(1):13-21[6]Toru Tanzawa. A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage[C]. IEEE International Symposium on Circuits and Systems, Seattle, May 18-21, 2008: 2302-2305.[7]Yen Cheng-Cheng, Liao Chi-Sheng, and Ker Ming-Dou. New transient detection circuit for system-level ESD protection[C]. IEEE International Symposium on VLSI Design, Automation and Test, Hsinchu, April 23-25, 2008: 180-183.[8]Choi W B. Power-on reset circuit[P]. U S, No. 20080100351, 2008.[9]Lai Xin-quan, Yu Wei-xue, and Li Gang, et al.. A low quiescent current and reset time adjustable power-on reset circuit[C]. 6th International Conference on ASIC, Shanghai, Oct. 2005, 2: 559-562.
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出版历程
  • 收稿日期:  2009-06-12
  • 修回日期:  2009-09-18
  • 刊出日期:  2010-06-19

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