机械电子工业部电子标准化研究所等. GJB/Z27-92 电子设备可靠性热设计手册[S]. 北京: 国防科学技术工业委员会批准,1992: 3-6.Institute of Electronics Standardization(MMBEI), et al..GJB/Z27-92 Thermal design handbook for reliability ofelectronics equipment[S]. Beijing: Commission of SeienceTechndogy and Industry for National Defense, 1992: 3-6.[2]ANSYS Company. ANSYS Release 10.0 Help. 2005.[3]刘红民, 张锐, 阴和俊. 星载EPC的可靠性分析[J].电子与信息学报.2004, 26(7):1168-1172浏览[4]黄艳飞, 张荣标, 凌万水等. 基于有限元的PCB 板上关键元件热可靠性分析[J]. 微计算机信息, 2005, 21(11-2): 164-165.Huang Yan-fei, Zhang Rong-biao, and Ling Wan-shui, etal..The analysis of heat reliability of the key component onPCB board [J]. Microcomputer Information, 2005, 21(11-2):164-165.[5]付桂翠, 高泽溪, 方志强等. 电子设备热分析技术研究[J]. 电子机械工程, 2004, 20(1): 13-16.Fu Gui-cui, Gao Ze-xi, and Fang Zhi-qiang, et al.. A study onthermal analysis of electronic system [J]. Electro-MechanicalEngineering, 2004, 20(1): 13-16.[6]李方明. 电子设计自动化技术及应用[M]. 北京: 清华大学出版社, 2006: 405-406.Li Fang-ming. Technology and Application of ElectronicsDesign and Automatization [M]. Beijing: Tsinghua UniversityPress, 2006: 405-406.[7]马之庚, 任陵柏. 现代工程材料手册[M]. 北京: 国防工业出版社, 2005: 22-27.Ma Zhi-geng and Ren Ling-bai. Modern Engineering MaterialHandbook[M]. Beijing, National Defense Industry Press, 2005:22-27.[8]李振民, 张锐, 阴和俊. 一种基于红外热成像技术的星载EPC 可靠性状态检测方案研究[J].电子与信息学报.2004,26(3):410-415浏览
|