基于超像素和游程直方图的对比度修改检测算法

高铁杠; 杨亮; 宣妍; 佟静

doi:10.11999/JEIT160161

基于超像素和游程直方图的对比度修改检测算法

doi: 10.11999/JEIT160161

基金项目:

天津市自然科学基金(16JCYBJC15700)

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- 文章访问数: 1421
- HTML全文浏览量: 151
- PDF下载量: 547
- 被引次数: 0
出版历程
- 收稿日期: 2016-02-19
- 修回日期: 2016-08-01
- 刊出日期: 2016-11-19

Contrast Modification Forensic Algorithm Based on Superpixel and Histogram of Run Length

Funds:

Tianjin Natural Science Foundation (16JCYBJC 15700)

摘要

摘要: 该文提出一种基于超像素和游程直方图的图像对比度修改检测取证算法。算法首先对图像进行超像素分割，并提取每个分割区域的游程直方图特征值，然后将不同方向的特征值进行融合，并进行归一化处理；再计算处理后的特征值数值突变量；最后将区域的数值突变量用支持向量机(SVM)进行分类识别。实验结果表明，和现有的一些算法相比，该文提出的算法计算复杂度低，在多种不同的测试数据库上都具有良好的识别性能。此外，在区域篡改检测实验中，该算法不仅可以定位出篡改区域，还能准确地描绘出篡改区域的轮廓形状。
- 图像处理 /
- 对比度修改 /
- 超像素 /
- 游程直方图 /
- 数值突变量 /
- 支持向量机(SVM)
Abstract: A novel image forensic algorithm against contrast modification based on superpixel and histogram of run length is proposed. In the proposed algorithm, images are firstly divided by superpixel, then run length histogram features of each block are extracted, and those of different orientation are subsequently merged. After normalization of the prior features, the leaps in the histogram are calculated numerically. Lastly, the generated features of blocks are trained by Support Vector Machin (SVM) classifier. Large amounts of experiments show that, the proposed algorithm has low cost of computation complexity. And compared with some state-of-the-art algorithms, it has better performance with many test databases. Furthermore, the proposed algorithm can not only located the tempered area, but also can exactly describe the shape of tempered area.
- Image processing /
- Contrast modification /
- Superpixel /
- Run length histogram /
- Leaps in the histogram numerically /
- Support Vector Machin (SVM)

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参考文献(22)

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文章访问数: 1421
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基于超像素和游程直方图的对比度修改检测算法

doi: 10.11999/JEIT160161

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Contrast Modification Forensic Algorithm Based on Superpixel and Histogram of Run Length

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基于超像素和游程直方图的对比度修改检测算法

doi: 10.11999/JEIT160161

计量

出版历程

Contrast Modification Forensic Algorithm Based on Superpixel and Histogram of Run Length

计量

出版历程

目录