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基于65 nm工艺的多端口可配置PUF电路设计

李刚 汪鹏君 张跃军 钱浩宇

李刚, 汪鹏君, 张跃军, 钱浩宇. 基于65 nm工艺的多端口可配置PUF电路设计[J]. 电子与信息学报, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
引用本文: 李刚, 汪鹏君, 张跃军, 钱浩宇. 基于65 nm工艺的多端口可配置PUF电路设计[J]. 电子与信息学报, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
Citation: LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968

基于65 nm工艺的多端口可配置PUF电路设计

doi: 10.11999/JEIT150968
基金项目: 

国家自然科学基金(61474068, 61274132),浙江省自然科学基金(LQ14F040001),浙江省教育厅项目(Y201430798)

Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology

Funds: 

The National Natural Science Foundation of China (61474068, 61274132), The Natural Science Foundation of Zhejiang Provice (LQ14F040001), The Project of Department of Education of Zhejiang Provice (Y201430798)

  • 摘要: 物理不可克隆函数(Physical Unclonable Function, PUF)电路利用结构完全相同的电路在制造过程中存在的随机工艺偏差,产生具有唯一性、随机性和不可克隆性的密钥。该文通过对共源共栅电流镜的研究,提出一种基于电流镜工艺偏差的多端口可配置PUF电路。该PUF电路由输入寄存器、偏差电压源、复用网络、判决器阵列和扰乱模块构成,通过激励信号配置偏差电压源,无需更换硬件便可实现输出密钥的变化,且可在一个时钟周期内输出多位密钥。在SMIC 65 nm CMOS工艺下,采用全定制方式设计具有36个输出端口的PUF电路,版图面积为24.8 m77.4 m。实验结果表明,该PUF电路具有良好的唯一性和随机性,且工作在不同温度(-40~125C)和电压(1.08~1.32 V)下的可靠性均大于97.4%,可应用于信息安全领域。
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出版历程
  • 收稿日期:  2015-08-24
  • 修回日期:  2016-01-20
  • 刊出日期:  2016-06-19

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