基于电路状态信息和冲突分析的部分扫描设计

向东; 刘鑫; 徐奕

基于电路状态信息和冲突分析的部分扫描设计

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出版历程
- 收稿日期: 2002-08-14
- 修回日期: 2002-12-31
- 刊出日期: 2004-01-19

Partial Scan Design Based on Circuit State Information and Conflict Analysis

摘要

摘要: 该文提出了一种割断关键回路的方法来选择扫描触发器。该方法在选择一定数量的扫描触发器后，采用逻辑模拟更新电路的状态信息，这样可以得到更为精确的可测试性信息。当电路中的关键回路割断后，转向消除冲突的处理，而不是降低时序深度。该方法致力于消除冲突，并使用了一种基于冲突分析的测度conflict。足够的实验结果表明该方法是非常有效的。
- 有效状态; 部分扫描设计; 无效状态; 冲突; 测度
Abstract: A multiple phase partial scan design method that breaks critical cycles using a combination of valid circuit state information and conflict analysis is proposed. It is quite cost-effective to obtain circuit state information via logic simulation, therefore, circuit state information is iteratively updated after a given number of partial scan flip-fiops being selected. When all critical cycles in the circuit are broken, our method turns to the con-flict resolution process using an intensive conflict-analysis-based testability measure conflict rather than reducing the sequential depth. The proposed method tries to eliminate the con-flicts and uses a conflict-analysis-based testability measure conflict. Sufficient experimental results are presented to validate the method.

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参考文献(1)

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