Xu Xiao-wen, Su Dong-lin, Guo Jun-feng, Liu Zhi-hang. The Measurement Uncertainties of Conducted Emission[J]. Journal of Electronics & Information Technology, 2006, 28(10): 1963-1966.
Citation:
Xu Xiao-wen, Su Dong-lin, Guo Jun-feng, Liu Zhi-hang. The Measurement Uncertainties of Conducted Emission[J]. Journal of Electronics & Information Technology, 2006, 28(10): 1963-1966.
Xu Xiao-wen, Su Dong-lin, Guo Jun-feng, Liu Zhi-hang. The Measurement Uncertainties of Conducted Emission[J]. Journal of Electronics & Information Technology, 2006, 28(10): 1963-1966.
Citation:
Xu Xiao-wen, Su Dong-lin, Guo Jun-feng, Liu Zhi-hang. The Measurement Uncertainties of Conducted Emission[J]. Journal of Electronics & Information Technology, 2006, 28(10): 1963-1966.
Based on the conducted emission measurements for the power line , the measurement uncertainties which affect the Electro Magnetic Compatibility(EMC) test are analyzed. This paper investigates the type A and type B uncertainties and the systemic errors. The results show that the tiny difference of the test setup can bring much difference.
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