Fujiwara E, Pradhan D K. Computers, 1990, 23(7): 63-72.[2]Chen C L, Hsiao M Y. IBM J Res. Develop.. 1984, 28(2): 120-L34.[3]Stapper C H, et al. IEEE Trans. on Reliability, 1993, R-42(4): 596-603.[4]Wilkinson D C, Journal of Spacecraft and Rockets, 1994, 31(2): 160-165.[5]Underwood C I, Ward J W, et al. IEEE Trans, on Nuclear Science, 1992, NS-39(6): 1817-1827.[6]Newman D B, Hutton S J. Journal of the British Interplanetary Society, 1992, 45(3): 121-126.[7]隋厚堂.用单个纠错码来提高半导体存储器的可靠性.空间探测专业委员会第六次会议论文,湖南 张家界: 1992-11,10-15.[8]Schwarty J W, Wolf J K. IEEE Trans. on Computers, 1990, C-39(11):1403-1404.[9]WalkPr W K S, Sundberg C E, Black C J. IEEE Trans. on Computers, 1979, C-28(7): 493-500.[10]Karp S, Gilbert B K. IEEE Trans. nn AES. 1993,AES-29( 2 ) : 310-316.[11]White J B, IEEE Trans. on AES, 1982, AES-18(1): 39-47.[12]ONell P M, Badhwar G D. IEEE Trans. on NS, 1994, 41(5): 1755-1764.[13]隋厚堂.系统(16 , 8)码的错误分布和性能比较.空间探测专业第一七次会议论文集,浙江舟山:1994-10,265-268.[14]Dhillon B S. Reliability in computer system design. Norwood, NJ: Ablex Publishing Corporation,1987.
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