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Volume 24 Issue 4
Apr.  2002
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Wang Xiaolan, Dai Bowei, Yang Ruliang. Statistical analysis of multilook signatures for polarimetric SAR image[J]. Journal of Electronics & Information Technology, 2002, 24(4): 507-513.
Citation: Wang Xiaolan, Dai Bowei, Yang Ruliang. Statistical analysis of multilook signatures for polarimetric SAR image[J]. Journal of Electronics & Information Technology, 2002, 24(4): 507-513.

Statistical analysis of multilook signatures for polarimetric SAR image

  • Received Date: 2000-04-27
  • Rev Recd Date: 2000-08-15
  • Publish Date: 2002-04-19
  • Based on the multiplication speckle model, the statistical characteristics of the polarimetric signatures are analyzed,which include co-polar and cross-polar ratios and co-polar phase difference for multi-look polarimetric SAR data. With the simulated data, the effect of the estimated accuracy of the polarimetric signatures on the performance of the algorithm for suppressing the speckle is analyzed. in addition, based on the features of the polarimetric signatures, applying them on the Bayes classifier, the accuracy of classification can be compared with the optimum polarimetric classifier.
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  • L.M. Novak, M. C. Burl, Optimal speckle reduction in polarimetric SAR imagery, IEEE Trans.on Aerospace and Electronic Systems, 1990, AES-26(2), 293-304.[2]Jong-Sen Lee, M. R. Grunes, Speckle reduction in multipolarization, multifrcquency SAR imagery,IEEE Trans. on Geoscicence and Remote Sensing, 1991, GRS-29(4), 535-544.[3]I.R. Joughin, D. P. Winebrenner, Probability density functions for multilook polarimetric signatrures, IEEE Trans. on Geoscience and Remote Sensing, 1994, GRS-32(3), 562-574.[4]M.C. Teich, P. Diament, Multiply stochastic representations for K distributions and their Poisson transforms, J. Opt. Soc. Amer., 1989, 6(1), 80-91.[5]L. M. Novak, Generating correlated Weibull random variables for digital simulations. In Proc. of IEEE Decision and Control Conference, San Diego, CA, 1973, 156-160.[6]L.M. Novak, R. T. Shin, Identification of terrain cover using the optimum polarimetric classifier,Journal of Electromagnetic Waves and Application, 1987, 2(2), 171-194.
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