Active Accelerated Recovery for Extended Chip Lifetime: Opportunities and Challenges

GUO Xinfei

doi:10.11999/JEIT230323

Volume 45 Issue 9

Sep. 2023

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Article Navigation > Journal of Electronics & Information Technology > 2023 > 45(9): 3057-3068

GUO Xinfei. Active Accelerated Recovery for Extended Chip Lifetime: Opportunities and Challenges[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3057-3068. doi: 10.11999/JEIT230323

Citation:

GUO Xinfei. Active Accelerated Recovery for Extended Chip Lifetime: Opportunities and Challenges[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3057-3068. doi: 10.11999/JEIT230323

GUO Xinfei. Active Accelerated Recovery for Extended Chip Lifetime: Opportunities and Challenges[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3057-3068. doi: 10.11999/JEIT230323

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Active Accelerated Recovery for Extended Chip Lifetime: Opportunities and Challenges

doi: 10.11999/JEIT230323

GUO Xinfei^,

University of Michigan – Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai 200240, China

Funds: The National Natural Science Foundation of China (62201340)

Received Date: 2023-04-26
Rev Recd Date: 2023-07-25

Available Online: 2023-08-04

Publish Date: 2023-09-27

Abstract

Abstract

The higher level of integration and smaller feature size in advanced technology nodes have led to increased electrical field and current density, which worsen further the chip aging issues. Current design solutions against aging are still based on guardband or extra timing margins, which can lead to overdesign. In recent years, multiple research work have demonstrated with experiments that several dominating aging effects can be recovered, and this recovery can be further accelerated. The necessary timing margin can be significantly lowered, inspiring the active accelerated recovery design concept. In this paper, current design solutions against aging and the progress that has been made in active accelerated recovery are reviewed. Potential opportunities introduced by this new method have been identified. Based on aspects of modeling, circuit design and system design, design challenges and their potential solutions to enable on-chip implementations are investigated. A concept of adaptive system that is based on sensing and active accelerated recovery has been proposed.
- Active accelerated recovery,
- Reliability,
- Aging,
- Bias Temperature Instability (BTI),
- Electromigration

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References(41)

References

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