Advanced Search
Volume 45 Issue 9
Sep.  2023
Turn off MathJax
Article Contents
CHEN Xinhui, NI Li, LIU Zijian, ZHANG Yuejun, CHEN Qilai, LIU Gang. Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3331-3339. doi: 10.11999/JEIT221086
Citation: CHEN Xinhui, NI Li, LIU Zijian, ZHANG Yuejun, CHEN Qilai, LIU Gang. Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3331-3339. doi: 10.11999/JEIT221086

Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor

doi: 10.11999/JEIT221086
Funds:  The National Natural Science Foundation of China (61871244, 62104267), The Fundamental Research Funds for the Provincial Universities of Zhejiang (SJLY2020015), The Fresh Talent Programme for Science and Technology Department of Zhejiang Province (2022R474A001), The Projects of Major (Key) Science and Technology Research in Jinhua (2021-1-014)
  • Received Date: 2022-08-17
  • Rev Recd Date: 2022-10-28
  • Available Online: 2022-11-05
  • Publish Date: 2023-09-27
  • Physical Unclonable Functions(PUF) are widely used in various fields as hardware security primitives. Considering the problems of vulnerability to modeling attacks and low stability of traditional CMOS-based PUF, a memristive Glitch-PUF circuit is proposed in this paper. The non-volatility and resistive effect of memristor are used to achieve the complete set of binary logic circuit. Then, the glitch generation circuit is designed based on the logic complete sets and competition and risk taking phenomenon, the stable glitch is obtained by varying the delay time, which is controlled by the path of the current flowing through crossbar array. Finally, the sampling circuit is designed according to the computing in memory characteristics of the memristor and Schmidt hysteresis effect, and the Glitch-PUF is verified. The experimental results show that the anti-modeling attack of designed Glitch-PUF is improved about 4.9%~14.3%, the randomness reaches 98.2%, and the Bit Error Rate(BER) is 0.08%, showing excellent robustness and stability.
  • loading
  • [1]
    GENKIN D, PIPMAN I, and TROMER E. Get your hands off my laptop: Physical side-channel key-extraction attacks on PCs[J]. Journal of Cryptographic Engineering, 2015, 5(2): 95–112. doi: 10.1007/s13389-015-0100-7
    [2]
    WANG Xiaoxiao and TEHRANIPOOR M. Novel physical unclonable function with process and environmental variations[C]. 2010 Design, Automation & Test in Europe Conference & Exhibition, Dresden, Germany, 2010: 1065–1070.
    [3]
    ZHAO Qiang, WU Yiheng, ZHAO Xiao, et al. A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2020, 28(6): 1449–1460. doi: 10.1109/TVLSI.2020.2980306
    [4]
    HE Zhangqing, WAN Meilin, DENG Jie, et al. A reliable strong PUF based on switched-capacitor circuit[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2018, 26(6): 1073–1083. doi: 10.1109/TVLSI.2018.2806041
    [5]
    GOVINDARAJ R, GHOSH S, and KATKOORI S. Design, analysis and application of embedded resistive RAM based strong arbiter PUF[J]. IEEE Transactions on Dependable and Secure Computing, 2020, 17(6): 1232–1242. doi: 10.1109/TDSC.2018.2866425
    [6]
    AVVARU S V S, ZENG Ziqing, and PARHI K K. Homogeneous and heterogeneous feed-forward XOR physical unclonable functions[J]. IEEE Transactions on Information Forensics and Security, 2020, 15: 2485–2498. doi: 10.1109/TIFS.2020.2968113
    [7]
    MANDRY H, HERKLE A, MÜELICH S, et al. Normalization and multi-valued symbol extraction from RO-PUFs for enhanced uniform probability distribution[J]. IEEE Transactions on Circuits and Systems II:Express Briefs, 2020, 67(12): 3372–3376. doi: 10.1109/TCSII.2020.2980748
    [8]
    YE Jing, GUO Qingli, HU Yu, et al. Modeling attacks on strong physical unclonable functions strengthened by random number and weak PUF[C]. 2018 IEEE 36th VLSI Test Symposium (VTS), San Francisco, USA, 2018: 1–6,
    [9]
    张跃军, 汪鹏君, 李刚, 等. 基于信号传输理论的Glitch物理不可克隆函数电路设计[J]. 电子与信息学报, 2016, 38(9): 2391–2396. doi: 10.11999/JEIT151312

    ZHANG Yuejun, WANG Pengjun, LI Gang, et al. Design of glitch physical unclonable functions circuit based on signal transmission theory[J]. Journal of Electronics &Information Technology, 2016, 38(9): 2391–2396. doi: 10.11999/JEIT151312
    [10]
    NOZAKI Y, TAKEMOTO S, IKEZAKI Y, et al. Performance evaluation of unrolled cipher based Glitch PUF implemented on Virtex-7[C]. 2021 International Symposium on Devices, Circuits and Systems (ISDCS), Higashihiroshima, Japan, 2021: 1–4.
    [11]
    NI Li, WANG Pengjun, ZHANG Yuejun, et al. A reliable multi-information entropy Glitch PUF using schmitt trigger sampling method for IoT security[C]. 2021 IEEE 14th International Conference on ASIC (ASICON), Kunming, China, 2021: 1–4.
    [12]
    董永兴, 徐金甫, 李军伟. 基于延时控制的Glitch PUF电路设计[J]. 计算机应用与软件, 2020, 37(11): 311–315,333. doi: 10.3969/j.issn.1000-386x.2020.11.050

    DONG Yongxing, XU Jinfu, and LI Junwei. Design of Glitch PUF based on delay control[J]. Computer Applications and Software, 2020, 37(11): 311–315,333. doi: 10.3969/j.issn.1000-386x.2020.11.050
    [13]
    张章, 李超, 韩婷婷, 等. 基于忆阻器的感存算一体技术综述[J]. 电子与信息学报, 2021, 43(6): 1498–1509. doi: 10.11999/JEIT201102

    ZHANG Zhang, LI Chao, HAN Tingting, et al. Review of the fused technology of sensing, storage and computing based on memristor[J]. Journal of Electronics &Information Technology, 2021, 43(6): 1498–1509. doi: 10.11999/JEIT201102
    [14]
    NI Li, WANG Penjun, ZHANG Yuejun, et al. An ACF<0.03 low-power software PUF based on the RISC-V processor for IoT security[J]. Microelectronics Journal, 2022, 121: 105362. doi: 10.1016/j.mejo.2022.105362
    [15]
    XI Xiaodan, ZHUANG Haoyu, SUN Nan, et al. Strong subthreshold current array PUF with 265 challenge-response pairs resilient to machine learning attacks in 130nm CMOS[C]. 2017 Symposium on VLSI Circuits, Kyoto, Japan, 2017: C268–C269.
    [16]
    ALVAREZ A, ZHAO Wenfeng, and ALIOTO M. 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm[C]. 2015 IEEE International Solid-State Circuits Conference-(ISSCC) Digest of Technical Papers, San Francisco, USA, 2015: 1–3.
    [17]
    MAHMOODI M R, NILI H, FAHIMI Z, et al. Ultra-low power physical unclonable function with nonlinear fixed-resistance crossbar circuits[C]. 2019 IEEE International Electron Devices Meeting (IEDM), San Francisco, USA, 2019: 30.1. 1–30.1. 4.
    [18]
    MAHMOODI M R, NILI H, and STRUKOV D B. RX-PUF: Low power, dense, reliable, and resilient physically unclonable functions based on analog passive RRAM crossbar arrays[C]. 2018 IEEE Symposium on VLSI Technology, Honolulu, USA, 2018: 99–100.
    [19]
    YANG Kaiyuan, DONG Qing, BLAAUW D, et al. A 553F2 2-transistor amplifier-based physically unclonable function (PUF) with 1.67% native instability[C]. 2017 IEEE International Solid-State Circuits Conference (ISSCC), San Francisco, USA, 2017: 146–147.
    [20]
    LU Lu, YOO T, and KIM T T H. A 6T SRAM based two-dimensional configurable challenge-response PUF for portable devices[J]. IEEE Transactions on Circuits and Systems I:Regular Papers, 2022, 69(6): 2542–2552. doi: 10.1109/TCSI.2022.3156983
    [21]
    VATALARO M, DE ROSE R, LANUZZA M, et al. Static CMOS physically unclonable function based on 4T voltage divider with 0.6%–1.5% bit instability at 0.4–1.8V operation in 180 nm[J]. IEEE Journal of Solid-State Circuits, 2022, 57(8): 2509–2520. doi: 10.1109/JSSC.2022.3151229
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Figures(12)  / Tables(3)

    Article Metrics

    Article views (471) PDF downloads(61) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return