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Volume 45 Issue 9
Sep.  2023
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CHEN Xinhui, NI Li, LIU Zijian, ZHANG Yuejun, CHEN Qilai, LIU Gang. Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3331-3339. doi: 10.11999/JEIT221086
Citation: CHEN Xinhui, NI Li, LIU Zijian, ZHANG Yuejun, CHEN Qilai, LIU Gang. Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3331-3339. doi: 10.11999/JEIT221086

Design of Highly Robust Glitch-Physical Uunclonable Functions Based on ZnO Memristor

doi: 10.11999/JEIT221086
Funds:  The National Natural Science Foundation of China (61871244, 62104267), The Fundamental Research Funds for the Provincial Universities of Zhejiang (SJLY2020015), The Fresh Talent Programme for Science and Technology Department of Zhejiang Province (2022R474A001), The Projects of Major (Key) Science and Technology Research in Jinhua (2021-1-014)
  • Received Date: 2022-08-17
  • Rev Recd Date: 2022-10-28
  • Available Online: 2022-11-05
  • Publish Date: 2023-09-27
  • Physical Unclonable Functions(PUF) are widely used in various fields as hardware security primitives. Considering the problems of vulnerability to modeling attacks and low stability of traditional CMOS-based PUF, a memristive Glitch-PUF circuit is proposed in this paper. The non-volatility and resistive effect of memristor are used to achieve the complete set of binary logic circuit. Then, the glitch generation circuit is designed based on the logic complete sets and competition and risk taking phenomenon, the stable glitch is obtained by varying the delay time, which is controlled by the path of the current flowing through crossbar array. Finally, the sampling circuit is designed according to the computing in memory characteristics of the memristor and Schmidt hysteresis effect, and the Glitch-PUF is verified. The experimental results show that the anti-modeling attack of designed Glitch-PUF is improved about 4.9%~14.3%, the randomness reaches 98.2%, and the Bit Error Rate(BER) is 0.08%, showing excellent robustness and stability.
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