Design of Novel Dynamic March Algorithm Based on Memory Built-in Self-test

CAI Zhikuang; YU Haojie; YANG Hang; WANG Zixuan; GUO Yufeng

doi:10.11999/JEIT221032

Volume 45 Issue 9

Sep. 2023

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Article Navigation > Journal of Electronics & Information Technology > 2023 > 45(9): 3420-3429

CAI Zhikuang, YU Haojie, YANG Hang, WANG Zixuan, GUO Yufeng. Design of Novel Dynamic March Algorithm Based on Memory Built-in Self-test[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3420-3429. doi: 10.11999/JEIT221032

Citation:

CAI Zhikuang, YU Haojie, YANG Hang, WANG Zixuan, GUO Yufeng. Design of Novel Dynamic March Algorithm Based on Memory Built-in Self-test[J]. Journal of Electronics & Information Technology, 2023, 45(9): 3420-3429. doi: 10.11999/JEIT221032

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Design of Novel Dynamic March Algorithm Based on Memory Built-in Self-test

doi: 10.11999/JEIT221032

College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

Funds: The National Key Research and Development Program of China (2018YFB2202005)，The National Natural Science Foundation of China(61974073), The Postgraduate Research & Practice Innovation Program of Jiangsu Province (SJCX21_0272)

Received Date: 2022-08-08
Accepted Date: 2022-12-20
Rev Recd Date: 2022-12-07

Available Online: 2022-12-22

Publish Date: 2023-09-27

Abstract

Abstract

As the largest module and one of the most important modules in the System on Chip (SoC), the stability and reliability of memory are related to whether the whole chip can work normally. In order to improve the test efficiency of memory, a novel Dynamic March algorithm—Dynamic-RAWC is proposed. The fault detection effect of the Dynamic-RAWC algorithm is better than that of the classic March RAW algorithm: the dynamic fault coverage is increased by 31.3%. This considerable effect is due to the fact that the test elements of Hammer, March C+ algorithm and some new test elements are integrated into the proposed algorithm which is optimized based on the classic March RAW algorithm. In contrast to ordinary March-type algorithms which have fixed elements, the proposed algorithm supports the user to customize the execution order of the algorithm to meet the detection needs of different faults model, and can dynamically switch the algorithm elements, adjusting between the time complexity and the fault coverage to achieve a good balance.
- Memory Built-In Self-Test (MBIST),
- March algorithm,
- Dynamic fault,
- Fault coverage

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References(15)

References

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