介质复数介电常数的微波测量
MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT
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摘要: 本文推广了Roberts-Hippel公式,对介质中相位常数编制的计算程序使我们能很快地得到它的多值解。该方法不需要特殊设备,但能满足一般介质材料的测量精度要求。
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关键词:
- 复数介电常数; 微波测量; CAM
Abstract: ABSTRACT In this paper, the formula given by S. Roberts and A. Von Hippel (1946) has been expanded. We make a program for calculating the phase constant of tested material which is put into the waveguide and for obtaining the multi-value solutions. The method for determining r and tan of a rested material does not need special equipments, but it can meet the accuracy requirement for resting ordinary materials. -
W. E. Courtney, IEEE Trans. on MTT, MTT-18(1970), 467.[2]S. Roberts, A. Von Hippel, J. Appl. Phys., 17(1946), 610.[3]T. W. Dakin, C. N. Works, J. Appl. Phys., 18(1947), 789-796.[4]D. M. Bowie and K. S. Kelleher, IRE Trans. on MTT, MTT-4(1956), 137. -
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