TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS

Mao Junfa; Li Zhengfan

Volume 19 Issue 1

Jan. 1997

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Article Navigation > Journal of Electronics & Information Technology > 1997 > 19(1): 72-76

Mao Junfa, Li Zhengfan. TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 72-76.

Citation:

Mao Junfa, Li Zhengfan. TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 72-76.

Mao Junfa, Li Zhengfan. TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 72-76.

Citation:

Mao Junfa, Li Zhengfan. TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 72-76.

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TRANSIENT SENSITIVITY ANALYSIS OF TRANSMISSION LINES IN HIGH-SPEED VLSI CIRCUITS

Received Date: 1995-01-03
Rev Recd Date: 1996-03-19
Publish Date: 1997-01-19

Abstract

Abstract

The characteristics method is introduced to analyze the transient sensitivity of transimission lines in high-speed VLSI circuits with respect to the transmission line parameters or terminal parameters, supplying a useful tool for the optimization design of interconnects in VLSI circuits. The characteristics method differs from the existing sensitivity analysis method based on the numerical inverse Laplace Transform(NILT) technique mainly in that the characteristics method can deal with nonlinear terminals and arbitrary transmitted signals.

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References

Djordjevic A R, Sarkar T K, Harrington R F. Time-domain response of multiconductor transmission[2]lines. Proc[J].IEEE.1987, 75(6):743-765[3]Mao J-F, Li Z-F. Analysis of the time response of multiconductor transmission lines with frequency-dependent losses by the method of convolution-characteristics. IEEE Trans, on MTT, 1992, MTT-40(4): 637-644.[4]Lum S, Nakhla M S, Zhang Q J. Sensitivity analysis of lossy coupled transmission lines. IEEE Trans on MTT, 1991, MTT-39(12): 2089-2099.[5]Zhang Q J, Lum S, Nakhla M S. Minimization of delay and crosstalk in high-speed VLSI interconnests. IEEE Trans, on MTT, 1992, MTT-40(7): 1555-1563.[6]Rahal-Arabi T, Suarez-Gattner R. A frequency-domain technique for the optimization of the electrical[7]performance of high speed multiconductor transmission-line networks in VLSI regimes. IEEE Trans. on CAS, part I, 1993, CAS-40(4): 262-296.[8]Branin Jr F H. Transient analysis of lossless transmission lines[J].Pros. IEEE.1967, 55(11):2012-2013[9]Orhanovic N, Tipathi V K, Wang P. Generalized method of characteristics for time domain simulation of multiconductor lossy transmission lines, IEEE ISCAS-S, U. S. A.: 1990, 2388-2391.

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