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Volume 8 Issue 1
Jan.  1986
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Xu Jiadong. MULTISTATE REPLECTOMETER[J]. Journal of Electronics & Information Technology, 1986, 8(1): 38-44.
Citation: Xu Jiadong. MULTISTATE REPLECTOMETER[J]. Journal of Electronics & Information Technology, 1986, 8(1): 38-44.

MULTISTATE REPLECTOMETER

  • Received Date: 1984-05-21
  • Rev Recd Date: 1985-07-26
  • Publish Date: 1986-01-19
  • A detail discussion on multistate technique and a comparison of it with the multiport technique are given. The relation between output powers and reflection of the device under test is shown. An experjmental millimeterwave multistate reflectometer is given and its measuring nesults are satisfactory.
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  • C. A Here, IEEE Trans. on IM, IM-21 (1972), 470.[2]G. F. Engen, ibid, IM-22(1973), 295.[3]G. P. Riblet, IEEE Trans. on MTT, MTT-29 (1981), 155.[4]L. C. Oldfield and J. P. Ide, Measurement of Complex Reflection Coefficient in,W-Band Measured Using a 4-port Reflecto-meter with Precision Waveguide Spacers, IEE Collcoquium on Advance in S-Parameter Measurement at Microwavelengths, in London, May 1983, pp.8/1-8/2.[5]E. J. Griffin, The Multistate reflectometer RSRE Memorandum No. 3625.[6]A. Jenkins, Seven Port Reflectometer, Ph. D. Thesis University College, London, 1982.
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