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Volume 22 Issue 1
Jan.  2000
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Shu Jianhua, Sun Chengxiu, Wang Qiming. THE RESEARCH OF ELECTRON TRANSFER IN MIM LIGHT EMISSION TUNNEL DIODE[J]. Journal of Electronics & Information Technology, 2000, 22(1): 144-150.
Citation: Shu Jianhua, Sun Chengxiu, Wang Qiming. THE RESEARCH OF ELECTRON TRANSFER IN MIM LIGHT EMISSION TUNNEL DIODE[J]. Journal of Electronics & Information Technology, 2000, 22(1): 144-150.

THE RESEARCH OF ELECTRON TRANSFER IN MIM LIGHT EMISSION TUNNEL DIODE

  • Received Date: 1998-06-01
  • Rev Recd Date: 1999-01-23
  • Publish Date: 2000-01-19
  • This paper reports the light emission from MIM tunnel diode and Negative Differential Resistance (NDR) in its I-V characteristic curve. By building the trapezoid potential barrier model and calculating the numerical solution of I-V characteristic curve with computer, it is found that the increment of potential barrier average width is agree with the experiment well. This increment of potential barrier average width is caused by the SPP s impeding and trapping effect upon tunneling electrons.
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