Study on grid emission of microwave power tubes

Wang Xiaoxia; Liao Xianheng; Zhao Qinglan; Yu Xiaojun; Zhang Jizhong

Volume 24 Issue 7

Jul. 2002

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Article Navigation > Journal of Electronics & Information Technology > 2002 > 24(7): 1005-1008

Wang Xiaoxia, Liao Xianheng, Zhao Qinglan, Yu Xiaojun, Zhang Jizhong. Study on grid emission of microwave power tubes[J]. Journal of Electronics & Information Technology, 2002, 24(7): 1005-1008.

Citation:

Wang Xiaoxia, Liao Xianheng, Zhao Qinglan, Yu Xiaojun, Zhang Jizhong. Study on grid emission of microwave power tubes[J]. Journal of Electronics & Information Technology, 2002, 24(7): 1005-1008.

Wang Xiaoxia, Liao Xianheng, Zhao Qinglan, Yu Xiaojun, Zhang Jizhong. Study on grid emission of microwave power tubes[J]. Journal of Electronics & Information Technology, 2002, 24(7): 1005-1008.

Citation:

Wang Xiaoxia, Liao Xianheng, Zhao Qinglan, Yu Xiaojun, Zhang Jizhong. Study on grid emission of microwave power tubes[J]. Journal of Electronics & Information Technology, 2002, 24(7): 1005-1008.

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Study on grid emission of microwave power tubes

Received Date: 2001-03-19
Rev Recd Date: 2001-08-10
Publish Date: 2002-07-19

Abstract

Abstract

Hf film is coated on the surface of Mo-grids by vacuum ion beam aided deposition technology. The SEM, XRD and RBS analyses are performed on modified Mo-grids. Life-span tests of this modified Mo-grid are carried out by diode experiment. When the temperature of the modified Mo-grids is kept at 650 ℃, the modified Mo-grids electron emission can not be detected with microammeter after 1000h life-span. The experimental results show that after the grid is contaminated by electron emission substance Ba of the cathode Hf formed compounds restrain effectively electron emission of grid.

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References(1)

References

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