MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT

Zhang Jinbiao; Shao Fangwu

Volume 10 Issue 1

Jan. 1988

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Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.

Citation:

Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.

Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.

Citation:

Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.

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MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT

Received Date: 1986-05-28
Rev Recd Date: 1987-01-05
Publish Date: 1988-01-19

Abstract

Abstract

ABSTRACT In this paper, the formula given by S. Roberts and A. Von Hippel (1946) has been expanded. We make a program for calculating the phase constant of tested material which is put into the waveguide and for obtaining the multi-value solutions. The method for determining r and tan of a rested material does not need special equipments, but it can meet the accuracy requirement for resting ordinary materials.

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References(1)

References

W. E. Courtney, IEEE Trans. on MTT, MTT-18(1970), 467.[2]S. Roberts, A. Von Hippel, J. Appl. Phys., 17(1946), 610.[3]T. W. Dakin, C. N. Works, J. Appl. Phys., 18(1947), 789-796.[4]D. M. Bowie and K. S. Kelleher, IRE Trans. on MTT, MTT-4(1956), 137.

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