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Volume 19 Issue 4
Jul.  1997
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Zheng Ji, Mao Junfa, Li Zhengfan. FULL WAVE ANALYSIS OF SIMULTANEOUS SWITCHING NOISE IN HIGH SPEED MCM BY THE METHOD OF CHARACTERISTICS[J]. Journal of Electronics & Information Technology, 1997, 19(4): 510-515.
Citation: Zheng Ji, Mao Junfa, Li Zhengfan. FULL WAVE ANALYSIS OF SIMULTANEOUS SWITCHING NOISE IN HIGH SPEED MCM BY THE METHOD OF CHARACTERISTICS[J]. Journal of Electronics & Information Technology, 1997, 19(4): 510-515.

FULL WAVE ANALYSIS OF SIMULTANEOUS SWITCHING NOISE IN HIGH SPEED MCM BY THE METHOD OF CHARACTERISTICS

  • Received Date: 1996-02-06
  • Rev Recd Date: 1996-09-05
  • Publish Date: 1997-07-19
  • High speed Multi-Chip Module (MCM) has been widely adopted in the complex system, where Simultaneous Switching Noise is one of the key factors affecting the system function. In this paper, two dimensional electromagnetic model is used to simulate power/ground plane simultaneous switching noise in MCM. A novel numerical method for the time-domain electromagnetic problems, named Method of Characteristics, is presented and used to solve the above problem. The results obtained is in accordance with that by the method of FD-TD and that reported by literature.
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  • Chan P C. Design automation for multi-chip module-issues and status. International Journal of High[2]Speed Electronics. 1991,2(4): 263-285.[3]Rainal A. Computing inductive noise of chip packages, ATT Bell Lab Tech. J., 1984, 63(1): 177-191.[4]Fang J, et al. Modeling of power ground plane noise in high-speed digital electronics packaging. IEEE 2nd Topical Meeting on Electrical Performance of Electronic Packaging, Conference Proceedings, Monterey,CA:Oct.20-22,1993,206-208.[5]Djordjevic A R, Sarkar T K. An investigation of Delta-I noise on integrated circuits. IEEE Trans. on EMC,1993,EMC-35(2):134-147.[6]Chen Y,et al. Modeling of Delta-I noise in digital electronics packaging. 1994 IEEE Multi-Chip[7]Module Conference, Conference Proceedings, Santa Cruz,CA.,USA:Mar.,15-17,1994,126-131.[8]南京大学数学系.偏徽分方程数值解法.北京:科学出版社,1979,第二章第七节.[9]Djordjevic A R, Sarkar T K. Analysis of time domain response of lossy multiconductor transmission line networks. IEEE Trans. on MTT,1987,MTT-35(10): 898-908.[10]Buechler D N, et al.Modeling sources in the FD-TD formulation and their use in quantifying source and boundary condition errors. IEEE Trans. on MTT, 1995, MTT-43(4): 810-814.
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