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Volume 24 Issue 2
Feb.  2002
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Kong Hongwei, Ruan Fang, Feng Zhongxi . One novel impleemntation of digital cross connect system with self-test[J]. Journal of Electronics & Information Technology, 2002, 24(2): 164-169.
Citation: Kong Hongwei, Ruan Fang, Feng Zhongxi . One novel impleemntation of digital cross connect system with self-test[J]. Journal of Electronics & Information Technology, 2002, 24(2): 164-169.

One novel impleemntation of digital cross connect system with self-test

  • Received Date: 2000-05-10
  • Rev Recd Date: 2000-09-11
  • Publish Date: 2002-02-19
  • One novel method of Self-Test is proposed in this paper to avoid the shortcomings of the traditional testing ways for digital cross-connect systems. By implementing the self-test functions in the system, the established connect can be easily tested with no need for special testing equipment. This can greatly ease the test of connect and system and save the investment with only a little increment of systems complexity. The idea to contain the self-test function in the system would be very helpful for accelerating the development of system and also for the verifying of the products.
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  • 黄锡伟等,数字数据网,北京,1997年,人民邮电出版社,15-40[2]MITEL, MT90820 Large Digital Switch, 美国, 1996, 2-179 2-190.[3]MITEL, ST-BUS generic device specification Application Notes, 美国, 1995, 1-8.[4]MOTOROLA.[J].MC68302 Integrated Multiprotocol Processor Users Manual, 美国.1993,:-[5]MITEL, MT9075 E1 single chip transceiver, 美国, 1997, 4-123-4-124.
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