A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE

Li Zhixin

Volume 7 Issue 3

May 1985

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Article Navigation > Journal of Electronics & Information Technology > 1985 > 7(3): 227-231

Li Zhixin. A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE[J]. Journal of Electronics & Information Technology, 1985, 7(3): 227-231.

Citation:

Li Zhixin. A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE[J]. Journal of Electronics & Information Technology, 1985, 7(3): 227-231.

Li Zhixin. A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE[J]. Journal of Electronics & Information Technology, 1985, 7(3): 227-231.

Citation:

Li Zhixin. A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE[J]. Journal of Electronics & Information Technology, 1985, 7(3): 227-231.

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A SIMPLE METHOD FOR MEASURING THE ADMITTANCE OF SLOT ON H-PLANE OF RECTANGULAR WAVEGUIDE

Li Zhixin

Received Date: 1983-07-27
Rev Recd Date: 1984-11-01
Publish Date: 1985-05-19

Abstract

Abstract

This paper proposes simple method for measuring the admittance of the inclinedslot on H-plane of rectangular waveguide of a slot array, and the measured results are given.

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