Liu Qishan, Zhuang Yiyuan, Hu Zhengyi, Zhang Zhaotang. A MICROWAVE POLAR INTERFEROMETER USING FOUR-PROBE PRINCIPLE[J]. Journal of Electronics & Information Technology, 1987, 9(4): 375-379.
Citation:
Liu Qishan, Zhuang Yiyuan, Hu Zhengyi, Zhang Zhaotang. A MICROWAVE POLAR INTERFEROMETER USING FOUR-PROBE PRINCIPLE[J]. Journal of Electronics & Information Technology, 1987, 9(4): 375-379.
Liu Qishan, Zhuang Yiyuan, Hu Zhengyi, Zhang Zhaotang. A MICROWAVE POLAR INTERFEROMETER USING FOUR-PROBE PRINCIPLE[J]. Journal of Electronics & Information Technology, 1987, 9(4): 375-379.
Citation:
Liu Qishan, Zhuang Yiyuan, Hu Zhengyi, Zhang Zhaotang. A MICROWAVE POLAR INTERFEROMETER USING FOUR-PROBE PRINCIPLE[J]. Journal of Electronics & Information Technology, 1987, 9(4): 375-379.
A microwave polar interferometer using four-probe principle is presented, in which four-probe system is replaced by two T-junction waveguides in series with a tunable phase shifter between them. The interferometer is specially suitable for measuring the parameters of plasma transient process, and has the capability of displaying transmission, reflection, and polar characteristic with the origin of its coordinates at the same time.The experimental photographs of a transient plasma in the daylight lamp are clear at frequencies of 10 GHz and 35GHz.
M. A. Heald and C. B. Warto, Plasma Diagnostics with Microwaves, John Wiley Sonc Inc.,New York, London, Sydney, pp. 192-241.[2]汤世贤,微波测量,国防工业出版社,1981年,第277-279页.[3]张兆镗,刘岐山,胡义正,庄义元,成都电讯工程学院学报,1984年, 第34期,第42-50页.
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