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Volume 18 Issue 3
May  1996
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Liu Yuling, Jin Jie, Xu Xiaohui, Zhang Dechen. RESEARCH ON REDUCING THE SELF-DOPING DURING SILICON CVD EPITAXY[J]. Journal of Electronics & Information Technology, 1996, 18(3): 332-336.
Citation: Liu Yuling, Jin Jie, Xu Xiaohui, Zhang Dechen. RESEARCH ON REDUCING THE SELF-DOPING DURING SILICON CVD EPITAXY[J]. Journal of Electronics & Information Technology, 1996, 18(3): 332-336.

RESEARCH ON REDUCING THE SELF-DOPING DURING SILICON CVD EPITAXY

  • Received Date: 1994-05-13
  • Rev Recd Date: 1995-06-12
  • Publish Date: 1996-05-19
  • This paper, first, analyzes self-doping mechanism, then develops an optimization technology by using the contrary compensation principle, adsorption-desorption mechanism and transform of viscous flow layer between static and dymanic conditons. It results in controlling efffectively self-doping under normal condition.
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  • 邓志杰.稀有金属,1994, 18(2): 143-149.[2]刘玉岭.半导体技术,1993, (3): 21-27.[3]Meyerson B S. Appl. Phy.,Lett., 1986, 48(12): 797-799.[4]Sinvan G R. J. Electrochem. Soc., 1980, 127(6): 1344-1346.[5]Zhou Z H. J. Vac. Sci. Technology, 1991, B9(2): 374-376.[6]Srinvasan S R. Slid State Tech., 1981, 124(1):101-104.[7]黄汉尧,李乃平.半导体器件工艺原理.上海:上海科技出版社,1985,45-54.[8]刘玉岭,等.实用发明创造工程学.石家庄:河北科技出版社,1993,269-274.
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