Xia Jun, Liang Changhong. THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 173-180.
Citation:
Xia Jun, Liang Changhong. THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 173-180.
Xia Jun, Liang Changhong. THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 173-180.
Citation:
Xia Jun, Liang Changhong. THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 173-180.
By applying the perturbation theory and complex-point method, theoretical research of the measurement of complex permittivity of uniaxial anisotropic materials, by means of an electromagnetic open resonator has been made, and the double refraction phenomenon due to the anisotropy of measured dielectric materials has been quantitatively analyzed. Finally, at 8mm band, an automated electromagnetic open resonator measurement system was used, and measurements have been made on some single-crystal quartz speciments.
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