MEASUREMENT OF PARAMETERS fL AND OF 1/f NOISE IN BJTBASED ON THE MEASURING METHOD OF NOISE CURRENT SPECTRA

Luo Tao; Dai Yisong; Xin Desheng

Volume 15 Issue 4

Jul. 1993

Turn off MathJax

Article Contents

Article Navigation > Journal of Electronics & Information Technology > 1993 > 15(4): 421-424

Luo Tao, Dai Yisong, Xin Desheng. MEASUREMENT OF PARAMETERS fL AND OF 1/f NOISE IN BJTBASED ON THE MEASURING METHOD OF NOISE CURRENT SPECTRA[J]. Journal of Electronics & Information Technology, 1993, 15(4): 421-424.

Citation:

Luo Tao, Dai Yisong, Xin Desheng. MEASUREMENT OF PARAMETERS fL AND OF 1/f NOISE IN BJTBASED ON THE MEASURING METHOD OF NOISE CURRENT SPECTRA[J]. Journal of Electronics & Information Technology, 1993, 15(4): 421-424.

Citation:

PDF( 606 KB)

MEASUREMENT OF PARAMETERS fL AND OF 1/f NOISE IN BJTBASED ON THE MEASURING METHOD OF NOISE CURRENT SPECTRA

Luo Tao^{①;戴逸松},
Dai Yisong,
Xin Desheng

Received Date: 1992-01-21
Rev Recd Date: 1992-05-25
Publish Date: 1993-07-19

Abstract

Abstract

The method and system for measuring parametros of fL and of 1/f noise in BJT are presented. Finally, the examples are given.

FullText(HTML)

References(1)

References

L. Loreck et al., IEEE Electron Device Lett., EDL-5(1984)1, 9.[2]C. D. Motchenbacken, F. C. Fitchen, Low-Noise Electronic Design, John Wiley Sons. Inc,[3]N. Y., (1973), Chapter 4.[4]M. Macucci et al., IEEE Trans. on IM, IM-40(1991)1, 7-12.[5]罗涛, 戴逸松,电子学报,18(1990)6,79-86.

Relative Articles

Supplements(0)

Cited By

Proportional views