Tian Xiaojian, Zhang Darning, Gao Yanjun, Li Dehui, Yi Maobin. APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE[J]. Journal of Electronics & Information Technology, 2000, 22(2): 346-349.
Citation:
Tian Xiaojian, Zhang Darning, Gao Yanjun, Li Dehui, Yi Maobin. APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE[J]. Journal of Electronics & Information Technology, 2000, 22(2): 346-349.
Tian Xiaojian, Zhang Darning, Gao Yanjun, Li Dehui, Yi Maobin. APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE[J]. Journal of Electronics & Information Technology, 2000, 22(2): 346-349.
Citation:
Tian Xiaojian, Zhang Darning, Gao Yanjun, Li Dehui, Yi Maobin. APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE[J]. Journal of Electronics & Information Technology, 2000, 22(2): 346-349.
This paper introduces the construction of the ultra-high speed waveform digitized system based on laser probe. The functions of different stages of the high-speed dynamic divider circuit chip are measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure and the characteristics of laser probe measurement is given.
Kolner B H, Bloom D M. Electronic sampling in GaAs integrated circuits. IEEE J. of QE., 1986,QE-22(1): 79-93.[2]Duvillaret L, Lourtioz J M, Chusseau L. Absolute voltage measurements on Ⅲ-V integrated circuits by internal electro-optic sampling[J].Electron. Lett.1995, 31(1):23-24[3]田小建,衣茂斌,等.倍频移相扫描电光采样测量.红外与毫米波学报,1997,16(3):190-192.[4]Mitsuru S, Tadao N. An automated electro-optic probing system for ultra-high-speed ICs. IEEE Trans. on Instrum. Meas., 1994, IM-43(6): 843-847.
DownLoad: