A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES

Yang Lingyun; Mao Duli

Volume 9 Issue 4

Jul. 1987

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Article Navigation > Journal of Electronics & Information Technology > 1987 > 9(4): 359-363

Yang Lingyun, Mao Duli. A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1987, 9(4): 359-363.

Citation:

Yang Lingyun, Mao Duli. A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1987, 9(4): 359-363.

Yang Lingyun, Mao Duli. A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1987, 9(4): 359-363.

Citation:

Yang Lingyun, Mao Duli. A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1987, 9(4): 359-363.

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A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES

Received Date: 1985-06-14
Rev Recd Date: 1986-10-20
Publish Date: 1987-07-19

Abstract

Abstract

For this probe, the beam spot diameter of the primary electron beam is 50-100m, the primary beam current is lower than 10-7A, and the energy of the primary electron (Ep) can be varied from 200 eV to 3 keV.By use of this probe, the secondary emission coefficient () versus Eq curve and the secondary emission distribution over the cathode surface can be measured, and the secondary emission image of the cathodes can also be displayed. Finally, the secondary emission of the pure nikel sample and impregnated dispenser cathode are measured.

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References(1)

References

R. Jepson and M. Muller, J. Appl. phys., 22(1951), 1196.[2]I. Brodie, Brit. J. Appl. Phys., 8(1957), 202.[3]J. B. Johnson, Phys. Rev., 66(1944), 952.[4]H. Salow, Z. Tech. Phys., 2(1940), 8.[5]童林风, 睢江程, 真空科学与技术,4(1984), 381.[6]刘学悫, 阴极电子学, 科学出版社, 北京,1980, P 395.[7]R. E. Thoms and C. D. Morrill, Appl Sur Sci., 16(1983), 292.[8]张恩虬,刘学悫, 电子科学学刊,6(1984), 89.

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