Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage

Zhao Zhi-dong; Pan Min; Chen Yu-quan

Volume 27 Issue 4

Apr. 2005

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Zhao Zhi-dong, Pan Min, Chen Yu-quan. Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage[J]. Journal of Electronics & Information Technology, 2005, 27(4): 536-539.

Citation:

Zhao Zhi-dong, Pan Min, Chen Yu-quan. Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage[J]. Journal of Electronics & Information Technology, 2005, 27(4): 536-539.

Zhao Zhi-dong, Pan Min, Chen Yu-quan. Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage[J]. Journal of Electronics & Information Technology, 2005, 27(4): 536-539.

Citation:

Zhao Zhi-dong, Pan Min, Chen Yu-quan. Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage[J]. Journal of Electronics & Information Technology, 2005, 27(4): 536-539.

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Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage

Received Date: 2003-10-09
Rev Recd Date: 2004-03-22
Publish Date: 2005-04-19

Abstract

Abstract

In this paper, the uniform threshold function of waveshrink is build.Cornputationally efficient formulas for computing bias, variance and risk of uniform threshold function are derived. These formulas provide a new way of understanding how waveshrink works. On the basis of this, the relation of bias, variance and risk of uniform threshold function(u=l,2,) with threshold value and wavelet coefficients are compared. These comparisons give the performance of waveshrink in finite sample situations.

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References(1)

References

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