Wei Yayi. STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN[J]. Journal of Electronics & Information Technology, 1992, 14(6): 661-665.
Citation:
Wei Yayi. STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN[J]. Journal of Electronics & Information Technology, 1992, 14(6): 661-665.
Wei Yayi. STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN[J]. Journal of Electronics & Information Technology, 1992, 14(6): 661-665.
Citation:
Wei Yayi. STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN[J]. Journal of Electronics & Information Technology, 1992, 14(6): 661-665.
The XPS, AES and EP have been used to study the elemental depth-distributions of secondary eletron emission layer of lead silicate glass reduced by hydrogen. The samples treated at different temperatures have differences in their micro-structures. The effects of different reduced temperature have been discussed, and new model of the layer of secondary electron emitter has been suggested
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