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Volume 27 Issue 7
Jul.  2005
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Xu Chuan-pei, Li Zhi, Mo Wei . Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm[J]. Journal of Electronics & Information Technology, 2005, 27(7): 1157-1161.
Citation: Xu Chuan-pei, Li Zhi, Mo Wei . Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm[J]. Journal of Electronics & Information Technology, 2005, 27(7): 1157-1161.

Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm

  • Received Date: 2004-02-09
  • Rev Recd Date: 2004-08-10
  • Publish Date: 2005-07-19
  • This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algorithms, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.
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  • Niermann T M, Patel J H. HITEC: A test generation package for sequential circuits. Proc. European Conf. Design Automation, Amsterdam, the Netherlands, 1992:214 - 218.[2]Cabodi G, Camurati P, Quer S. Symbolic exploration of large circuits with enhanced forward/backward traversals. Proc.EURODAC, Grenoble, Fr., 1994:22 - 27.[3]Saab D G, Saab Y G, Abraham J A. CRIS: A test cultivation program for sequential VLSI circuits. Proc. Int. Conf. Computer -Aided Design, Santa Clara, USA, 1992:216 - 219.[4]Rudnick E M, Patel J H, Greenstein G S, Niermann T M.Sequential circuit test generation in a genetic algorithm framework. Proc. Design Automation Conf., San Diego, USA,1994:698- 704.[5]李智,许川佩,陈光(禵).基于蚂蚁算法的同步时序电路初始化研究.电子测量与仪器学报,2002,(4):33-38.[6]李智,许川佩,莫玮,陈光(禵).基于蚂蚁算法和遗传算法的同步时序电路初始化.电子学报,2003,(8):1276-1280.[7]Hsiao M S, Rudnick E M, Patel J H. Dynamic state traversal for sequential circuit test generation[J].ACM Trans. on Design Automation of Electronic Systems.2000, 5(2):548-[8]陈国良,等.遗传算法及其应用.北京:电子工业出版社,1996.6:88-97.
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