MICROCOMPUTERIZED MEASUREMENT AND ANALYSIS OF ELECTRON EMISSION PROPERTIES OF THERMIONIC CATHODES

Zeng Haishan; Yang Linyun; Ye Yulin

Volume 10 Issue 2

Mar. 1988

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Article Navigation > Journal of Electronics & Information Technology > 1988 > 10(2): 165-173

Zeng Haishan, Yang Linyun, Ye Yulin . MICROCOMPUTERIZED MEASUREMENT AND ANALYSIS OF ELECTRON EMISSION PROPERTIES OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1988, 10(2): 165-173.

Citation:

Zeng Haishan, Yang Linyun, Ye Yulin . MICROCOMPUTERIZED MEASUREMENT AND ANALYSIS OF ELECTRON EMISSION PROPERTIES OF THERMIONIC CATHODES[J]. Journal of Electronics & Information Technology, 1988, 10(2): 165-173.

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MICROCOMPUTERIZED MEASUREMENT AND ANALYSIS OF ELECTRON EMISSION PROPERTIES OF THERMIONIC CATHODES

Received Date: 1986-02-14
Rev Recd Date: 1987-10-20
Publish Date: 1988-03-19

Abstract

Abstract

A microcomputerized measuring system is developed. This system automatically acquires an I-V characteristic curve in 5 seconds with an accuracy of 0.05% (ful scale-range). The Schottky extrapolation field-free emission, the inflection point emission, the flection point emission, the average effective work, function, the Richardson .work function, the work function distribution at the operation temperature and other important informations that reflect properties of cathode are obtained by this system. The results after analysing four type of cathodes demonstrate that this system is very suitable for measuring the property changes of the cathode in the processes of activation, ageing, poisoning and life test. It is proved that this system can also be used to monitor the property of the eathode in the assembled tube by measuring a grid controlled travelling-wave tube.

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References(1)

References

W. P. C. Mills, et al., Int. J. Electronics, 31(1971), 145.[2]M. J. Cattelino, G. V. Miram, W. R. Ayers, IEDM. San Francisco. 1982, p.36.[3]M. Feinleib, M. C. Green, IEDM, San Francisco, 1984, p.314.[4]A. H. Beck and De-an Wang, Int. J Electronics, 51(1981), 717.[5]J. Hasker, Application of Surface Science, 16(1983), 220.[6]C. E. Maloney, C. S. Fang, Applied Surface Science, 24(1985), 407.[7]J. C. Tonnerre, D. Brion, P. Palluel, A. M. Shroff, Application of Surface Science, 16(1983), 238.[8]杨凌云, 王书绅, 电子学通讯, 4(1982), 384.[9]刘学悫,阴极电子学,科学出版社,1980.[10]E. B. Hensley, J. Appl. Phys., 32(1961), 301.[11]American Standard Methods of Test Electron Tubes, American Standards Association Incorporated, 1963.[12]曾海山,热发射测量微机化与实用热阴极发射特性研究,中国科学院电子学研究所硕士论文,1986年9月.

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