Huang Yi, Shen Chuyu. A STATISTICAL MODEL OF MICROWAVE FET S-PARAMETER USING FACTOR ANALYSIS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 77-82.
Citation:
Huang Yi, Shen Chuyu. A STATISTICAL MODEL OF MICROWAVE FET S-PARAMETER USING FACTOR ANALYSIS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 77-82.
Huang Yi, Shen Chuyu. A STATISTICAL MODEL OF MICROWAVE FET S-PARAMETER USING FACTOR ANALYSIS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 77-82.
Citation:
Huang Yi, Shen Chuyu. A STATISTICAL MODEL OF MICROWAVE FET S-PARAMETER USING FACTOR ANALYSIS[J]. Journal of Electronics & Information Technology, 1997, 19(1): 77-82.
Factor analysis method is firstly used to establish 5 parameter statistical model of microwave FETs. This statistical model is compared with the one established by principal component analysis method. The results show that the statistical model by factor analysis is more accurate than that by principal component analysis
Meehan M D, Purviance J. Yield and Reliability in Microwave Circuit and System Design, Boston: Artech House, 1993, chapter 6, pp. 179-207.[2]Purvisnce J, et al. A linear statistical FET model using principal component analysis. IEEE Trans. on MTT, 1989, MTT-37(9): 1389-1394.[3]Joreskog K G. Factor analysis勿least squares and maximum likelihood, in Statistical Methods for[4]Digital Computers, K. Enstein, A. Ralston, and H. S. Wilf (eds.), New York: John Wiley, 1975. Chapter 2.[5]Bandler J W, et al. Integrated physics-oriented statistical modeling, simulation and optimization. IEEE Trans. on MTT, 1992; 40(6): 1374-1399.