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Volume 16 Issue 2
Mar.  1994
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Huang Liuxing, Wei Tongli, Zheng Jiang, Cao Juncheng. MODEL AND MODELING OF LOW TEMPERATURE CURRENT GAIN OF POLYSILICON EMITTER BIPOLAR TRANSISTOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 207-211.
Citation: Huang Liuxing, Wei Tongli, Zheng Jiang, Cao Juncheng. MODEL AND MODELING OF LOW TEMPERATURE CURRENT GAIN OF POLYSILICON EMITTER BIPOLAR TRANSISTOR[J]. Journal of Electronics & Information Technology, 1994, 16(2): 207-211.

MODEL AND MODELING OF LOW TEMPERATURE CURRENT GAIN OF POLYSILICON EMITTER BIPOLAR TRANSISTOR

  • Received Date: 1993-01-06
  • Rev Recd Date: 1993-05-11
  • Publish Date: 1994-03-19
  • A unified model of low temperature current gain of polysilicon emitter bipolar transistors based on effective recombination speed method is presented, incorporating bandgap narrowing, carrier freezing-out and tunneling of holes through interface oxide. The modeling results based on the unified model are in good agreement with experimental data.
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  • Yu Z, et al. IEEE Trans. on ED, 1984, ED-31(6): 773-784.[2]Suzuki K. IEEE Trans. on ED, 1991, ED-33(11): 2512-2518.[3]Blaudau W,et al. J. Appl. Phys., 1974, 45(4): 1846-1848.[4]Slotboom J W, et al. Solid-State Electron., 1976, 19(10):857-862.[5]Caughey D M, et al. Proc. IEEE, 1967, 52(12): 2192-2193.[6]王阳元,等. 多晶硅薄漠及其在集成电路中的应用.北京:科学出版社,1983,136-139.[7]Klaassen D B M. Solid-State Electron., 1992, 35(7): 953-967.[8]郑茳,等.电子科学学刊,1992,14(3): 325-328.[9]De Graaff H C, et al. IEEE Trans. on ED, 1979, ED-26(11): 1771-1776.
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