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Volume 45 Issue 4
Apr.  2023
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ZHAO Yaqin, YANG Rongqian, WU Longwen, HE Shengyang, NIU Jinpeng, ZHAO Liang. Specific Emitter Identification Based on Regression Analysis Theory[J]. Journal of Electronics & Information Technology, 2023, 45(4): 1227-1235. doi: 10.11999/JEIT220190
Citation: ZHAO Yaqin, YANG Rongqian, WU Longwen, HE Shengyang, NIU Jinpeng, ZHAO Liang. Specific Emitter Identification Based on Regression Analysis Theory[J]. Journal of Electronics & Information Technology, 2023, 45(4): 1227-1235. doi: 10.11999/JEIT220190

Specific Emitter Identification Based on Regression Analysis Theory

doi: 10.11999/JEIT220190
Funds:  The National Natural Science Foundation of China (61671185, 62071153)
  • Received Date: 2022-02-25
  • Accepted Date: 2022-09-06
  • Rev Recd Date: 2022-08-29
  • Available Online: 2022-09-09
  • Publish Date: 2023-04-10
  • Focusing on the problem that the signal characteristics are not related to the hardware composition in the specific emitter identification, two feature extraction methods are used in this paper: high-order spectral analysis and Variational Modal Decomposition (VMD) for research and analysis. The surrounding-line bispectral integration and improved VMD technology are used to extract and analyze the features of the hardware in the semi-physical simulation signal and Advanced Design System (ADS) output signal. Through ADS, the influence of emitter phase noise and nonlinear distortion of power amplifier on signal unintentional modulation characteristics is quantitatively analyzed, the correlation of variables is analyzed, and the significantly related variables are regressed and fitted to obtain their correlation regression function. Using the correlation between hardware and features, the traditional Support Vector Machines (SVM) classifier is improved to construct a correlation weight SVM classifier. Finally, the results show that the classification accuracy of weighted SVM is improved by more than 10% compared with single core SVM under the same signal-to-noise ratio.
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