Partial Scan Design Based on Circuit State Information and Conflict Analysis

Xiang Dong; Liu Xin; Xu Yi

Volume 26 Issue 1

Jan. 2004

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Article Navigation > Journal of Electronics & Information Technology > 2004 > 26(1): 124-130

Xiang Dong, Liu Xin, Xu Yi. Partial Scan Design Based on Circuit State Information and Conflict Analysis[J]. Journal of Electronics & Information Technology, 2004, 26(1): 124-130.

Citation:

Xiang Dong, Liu Xin, Xu Yi. Partial Scan Design Based on Circuit State Information and Conflict Analysis[J]. Journal of Electronics & Information Technology, 2004, 26(1): 124-130.

Xiang Dong, Liu Xin, Xu Yi. Partial Scan Design Based on Circuit State Information and Conflict Analysis[J]. Journal of Electronics & Information Technology, 2004, 26(1): 124-130.

Citation:

Xiang Dong, Liu Xin, Xu Yi. Partial Scan Design Based on Circuit State Information and Conflict Analysis[J]. Journal of Electronics & Information Technology, 2004, 26(1): 124-130.

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Partial Scan Design Based on Circuit State Information and Conflict Analysis

Received Date: 2002-08-14
Rev Recd Date: 2002-12-31
Publish Date: 2004-01-19

Abstract

Abstract

A multiple phase partial scan design method that breaks critical cycles using a combination of valid circuit state information and conflict analysis is proposed. It is quite cost-effective to obtain circuit state information via logic simulation, therefore, circuit state information is iteratively updated after a given number of partial scan flip-fiops being selected. When all critical cycles in the circuit are broken, our method turns to the con-flict resolution process using an intensive conflict-analysis-based testability measure conflict rather than reducing the sequential depth. The proposed method tries to eliminate the con-flicts and uses a conflict-analysis-based testability measure conflict. Sufficient experimental results are presented to validate the method.

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References(1)

References

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