USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI

Zhao Tianxu; Hao Yue; Zhou Shuisheng

Volume 23 Issue 1

Jan. 2001

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Article Navigation > Journal of Electronics & Information Technology > 2001 > 23(1): 96-99

Zhao Tianxu, Hao Yue, Zhou Shuisheng . USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI[J]. Journal of Electronics & Information Technology, 2001, 23(1): 96-99.

Citation:

Zhao Tianxu, Hao Yue, Zhou Shuisheng . USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI[J]. Journal of Electronics & Information Technology, 2001, 23(1): 96-99.

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USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI

Received Date: 1999-05-09
Rev Recd Date: 1999-10-13
Publish Date: 2001-01-19

Abstract

Abstract

An increase in chip area and circuit complexity leads to a reduction in the yield of production. In order to solve the problem of low yield by defects in process of large scale integrated circuits manufacture, the fault-tolerant technique is introduced into the integrated circuits design. A system must be provided with a certain quantity of spare elements to have the ability of fault-tolerance. In this paper, the problem of optimal spare allocation for fault-tolerant VLSI is solved effectively by means of genetic algorithm.

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References

C.Thibeault,Y.Savaria,J-L.Houle,A fast method to evaluate the optimum number of spares in defect-tolerant integrated circuits,IEEE Trans.on Comput.,1994,C-43(6),687-697.[2]W.Shi,W.K.Fuchs,Optimal spare allocation for defect-tolerant VLSI,in Proc.IEEE Int.Conf.Wafer Scale Integration,San Francisco,California,USA,1992,193-199.[3]云庆夏,黄光球,王战权,遗传算法和遗传规划,北京,冶金工业出版社,1997,21-38.[4]D.E.Goldberg,Genetic Algorithms in Search,Optimization and Machine Learning,Reading,MA,Addsion-Wesley,1989,97-108.

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