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Volume 23 Issue 11
Nov.  2001
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Liu Fang, Wang Runsheng . PREDICTING IMAGE ELEMENTS USING 2-D PROTECTIVE TRANSFORMATION FROM MULTIPLE VIEWS[J]. Journal of Electronics & Information Technology, 2001, 23(11): 1095-1101.
Citation: Liu Fang, Wang Runsheng . PREDICTING IMAGE ELEMENTS USING 2-D PROTECTIVE TRANSFORMATION FROM MULTIPLE VIEWS[J]. Journal of Electronics & Information Technology, 2001, 23(11): 1095-1101.

PREDICTING IMAGE ELEMENTS USING 2-D PROTECTIVE TRANSFORMATION FROM MULTIPLE VIEWS

  • Received Date: 2000-03-06
  • Rev Recd Date: 2000-07-17
  • Publish Date: 2001-11-19
  • 2-D projective collineation provides an ideal mathematical tool for describing planar element correspondence in multiple views. This paper extends the solution methods for 2-D projective transformation matrix from 4 points corresponding to variety combinations of points and lines corresponding, such as 4 points, 4 lines, 1 point and 3 lines, 3 lines and 1 point, and 2 points and 2 lines, etc. Based on the relationship between two views indicated as 2-D projective collineation, prediction problems about points or lines from two views or three views can be solved effectively. Without any estimating parameters involved, the prediction results accuracy is improved. Freely combining points and lines on describing relationship between views makes the application field wider. The methods proposed here have been verified by experimental results.
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  • O.D. Faugeras, L. Robert, What can two images tell us about a third one?, International Journalof Computer Vision, 1996, 18(3), 5-19.[2]Zhengyou Zhang, Determining the epipolar geometry and its Uncertainty, A Review, InternationalJournal of Computer Vision, 1998, 27(2), 161-195.[3]E.B. Barrett et al., Linear resection, intersection, and perspective-independent model matchingin photogrammetry: Theory, SPIE, Vol 1567, 1991, Applications of Digital Image ProcessingXIV, 142-169.[4]龙泽斌编著,几何变换,湖南科学技术出版社,1984年第一版,第三章.[5]L. Quan, Invariants of six points and projective reconstruction from three uncalibrated images,IEEE Trans. on Pattern Analysis and Machine Intelligence, 1995, 17(1), 34-46.
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