THEORETICAL ANALYSIS OF MCP NOISE FACTOR

Wei Yayi; Tao Zhaomin

Volume 15 Issue 6

Nov. 1993

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Wei Yayi, Tao Zhaomin. THEORETICAL ANALYSIS OF MCP NOISE FACTOR[J]. Journal of Electronics & Information Technology, 1993, 15(6): 655-658.

Citation:

Wei Yayi, Tao Zhaomin. THEORETICAL ANALYSIS OF MCP NOISE FACTOR[J]. Journal of Electronics & Information Technology, 1993, 15(6): 655-658.

Wei Yayi, Tao Zhaomin. THEORETICAL ANALYSIS OF MCP NOISE FACTOR[J]. Journal of Electronics & Information Technology, 1993, 15(6): 655-658.

Citation:

Wei Yayi, Tao Zhaomin. THEORETICAL ANALYSIS OF MCP NOISE FACTOR[J]. Journal of Electronics & Information Technology, 1993, 15(6): 655-658.

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THEORETICAL ANALYSIS OF MCP NOISE FACTOR

Received Date: 1992-07-17
Rev Recd Date: 1993-01-15
Publish Date: 1993-11-19

Abstract

Abstract

Based on the theoretical analysis, the formula of MCP noise taecror is suggested. The results of numerical calculation show that the MCP noise can be reduced by increasing the yield of secondary electrons at MCP entrance. Accroding to this results, the possibility of reducing the noise factor by depositing certain alka lihalide compounds at the entrance of the MCP channels is discussed.

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References(1)

References

H.[2]Pollehn et al.,Advancea in Eleclronics and Eleccronic Physics, A40, 21 (1976).[3]A. J. Guest, Acta Electronics, 14 (1971) 1, 99-110.[4]H. Bruining, Physics and Applications of Secondary Electron Emission, Springer-Verlag,(1954),pp.120-140.[5]N. B. Leonov et al., Sov. J. Opt. Technol. 48 (1981) 8, 740-743.[6]陶兆民,韦亚一,光电子技术,1992年,第1期,第59-64页.

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