Jia Gang, Yi Maobin, Sun Wei, Cao Jie, Sun Jianguo, Wang Jiasheng, Qin Li, Gao Dingsan. ELECTROOPTIC SIMPLING OF INTERNAL MICROWAVE SIGNALS IN GaAsCOPLANAR WAVEGUIDES[J]. Journal of Electronics & Information Technology, 1995, 17(2): 197-200.
Citation:
Jia Gang, Yi Maobin, Sun Wei, Cao Jie, Sun Jianguo, Wang Jiasheng, Qin Li, Gao Dingsan. ELECTROOPTIC SIMPLING OF INTERNAL MICROWAVE SIGNALS IN GaAsCOPLANAR WAVEGUIDES[J]. Journal of Electronics & Information Technology, 1995, 17(2): 197-200.
Jia Gang, Yi Maobin, Sun Wei, Cao Jie, Sun Jianguo, Wang Jiasheng, Qin Li, Gao Dingsan. ELECTROOPTIC SIMPLING OF INTERNAL MICROWAVE SIGNALS IN GaAsCOPLANAR WAVEGUIDES[J]. Journal of Electronics & Information Technology, 1995, 17(2): 197-200.
Citation:
Jia Gang, Yi Maobin, Sun Wei, Cao Jie, Sun Jianguo, Wang Jiasheng, Qin Li, Gao Dingsan. ELECTROOPTIC SIMPLING OF INTERNAL MICROWAVE SIGNALS IN GaAsCOPLANAR WAVEGUIDES[J]. Journal of Electronics & Information Technology, 1995, 17(2): 197-200.
A coaxial reflection-mode electrooptic sampling system is presented. This system has a temporal resolution less than 20 ps and a spatial resolution less than 3m. The internal microwave signals in GaAs coplanar waveguides have been probed by the system. This system will be apply to on-wafer tests of internal characters of GaAs high-speed integrated circuits.
Weingarten K J, Rodwell M J W, Bloom D M. IEEE J. of QE, 1988, QE-24(2): 198-220.[2]Weisenfeld J, M. IBM J. Res. Develop., 1990, 34(2/3): 141-161.[3]Shinagawa M, Magatsuma T. Electron[J].Lett.1990, 26(17):1341-1343[4][4][5]Nagatsuma T, Shinagawa M. Electron. Lett., 1991. 27(21): 1904-1905.
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