BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS

Du Zhengwei; Ruan Chengli

Volume 20 Issue 6

Nov. 1998

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Article Navigation > Journal of Electronics & Information Technology > 1998 > 20(6): 828-834

Du Zhengwei, Ruan Chengli. BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS[J]. Journal of Electronics & Information Technology, 1998, 20(6): 828-834.

Citation:

Du Zhengwei, Ruan Chengli. BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS[J]. Journal of Electronics & Information Technology, 1998, 20(6): 828-834.

Du Zhengwei, Ruan Chengli. BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS[J]. Journal of Electronics & Information Technology, 1998, 20(6): 828-834.

Citation:

Du Zhengwei, Ruan Chengli. BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS[J]. Journal of Electronics & Information Technology, 1998, 20(6): 828-834.

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BASIC PARAMETERS OF ASYMMETRICAL COPLANAR LINES WITH FINITE SUBSTRATE THICKNESS

Received Date: 1997-03-17
Rev Recd Date: 1997-09-23
Publish Date: 1998-11-19

Abstract

Abstract

In this paper, asymmetrical coplanar lines in free space are analyzed using confor-mal mapping techniques, and the exact solutions are obtained. Analytic closed-form expressions for the effective dielectric constant, the capacitance per unit length, the characteristic impedance and the wavelength of guided wave for asymmetrical coplanar lines with multi-layered finite substrate thickness are obtained. The analyses are useful for the (M)MIC s designs.

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References(1)

References

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