YANG Lijun, LI Minghang, LU Haitao, GUO Lin. Spoofing Attack Detection Scheme Based on Channel Fingerprint for Millimeter Wave MIMO System[J]. Journal of Electronics & Information Technology, 2023, 45(12): 4228-4234. doi: 10.11999/JEIT220934
Citation:
Lin Fu-min, Ding Yao-gen, Liu Tie-shan, Sun Xiao-xin. A Simulation Method for Computing the Gap Impedance Varying with Frequency of Output Cavity Loaded with a Filter[J]. Journal of Electronics & Information Technology, 2003, 25(12): 1688-1694.
YANG Lijun, LI Minghang, LU Haitao, GUO Lin. Spoofing Attack Detection Scheme Based on Channel Fingerprint for Millimeter Wave MIMO System[J]. Journal of Electronics & Information Technology, 2023, 45(12): 4228-4234. doi: 10.11999/JEIT220934
Citation:
Lin Fu-min, Ding Yao-gen, Liu Tie-shan, Sun Xiao-xin. A Simulation Method for Computing the Gap Impedance Varying with Frequency of Output Cavity Loaded with a Filter[J]. Journal of Electronics & Information Technology, 2003, 25(12): 1688-1694.
A simulated computation method is developed by theoretical analysis and de-duction to compute the gap impedance varying with frequency of output cavity loaded with a filter. Meanwhile, a practical example is used to show that how to compute the frequency and the loaded quality factor of the output cavity loaded with waveguide by this simulated computation method and the computed result is verified to be reasonable in theory. Finally, a output cavity loaded with a filter is computed and the computed result is analyzed and compared with cold test data in order to conform the reliability of this simulated computation method.
YANG Lijun, LI Minghang, LU Haitao, GUO Lin. Spoofing Attack Detection Scheme Based on Channel Fingerprint for Millimeter Wave MIMO System[J]. Journal of Electronics & Information Technology, 2023, 45(12): 4228-4234. doi: 10.11999/JEIT220934
YANG Lijun, LI Minghang, LU Haitao, GUO Lin. Spoofing Attack Detection Scheme Based on Channel Fingerprint for Millimeter Wave MIMO System[J]. Journal of Electronics & Information Technology, 2023, 45(12): 4228-4234. doi: 10.11999/JEIT220934